Abstract
In this paper, the imperfect maintenance model and proportional intensity model are considered for the repairable systems under accelerated stress. The age reduction model (Malik’s model) is assumed for imperfect maintenance. The stress acts multiplicatively on the baseline cumulative intensity. The log-likelihood function is derived and a maximizing procedure is proposed. In simulation studies, we investigate the accuracy and some properties of the estimation method.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Bagdonavius, V., Nikulin, M.: Accelerated Life Models. Chapman and Hall, Boca Raton (2002)
Brown, J.F., Mahoney, J.F., Sivazlian, B.D.: Hysteresis Repair in Discounted Replacement Problems. IIE Transactions 15, 156–165 (1983)
Cox, D.R., Oakes, D.: Analysis of Survival Data. Chapman and Hall, Boca Raton (1984)
Guerin, F., Dumon, B., Lantieri, P.: Accelerated Life Testing on Repairable Systems. In: Proceedings of Reliability and Maintainability Symposium, pp. 340–345 (2004)
Guida, M., Giorgio, M.: Reliability Analysis of Accelerated Life-Test Data from a Repairable System. IEEE Transactions on Reliability 44(2), 337–346 (1995)
Kalbfleisch, J.D., Prentice, R.L.: The Statistical Analysis of Failure Time Data. John Wiley & Sons, Canada (1980)
Malik, M.A.K.: Reliable Preventive Maintenance Scheduling. AIIE Transactions (11), 221–228 (1979)
Nelson, W.: Accelerated Testing; Statistical Models, Test Plans and Data Analysis. John Wiley & Sons, New York (1990)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2005 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Yun, W.Y., Kim, E.S. (2005). Estimating Parameters in Repairable Systems Under Accelerated Stress. In: Gervasi, O., et al. Computational Science and Its Applications – ICCSA 2005. ICCSA 2005. Lecture Notes in Computer Science, vol 3483. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11424925_59
Download citation
DOI: https://doi.org/10.1007/11424925_59
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-25863-6
Online ISBN: 978-3-540-32309-9
eBook Packages: Computer ScienceComputer Science (R0)