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Parameter Variation Effects on Timing Characteristics of High Performance Clocked Registers

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Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation (PATMOS 2005)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 3728))

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Abstract

Violations in the timing constraints of a clocked register can cause a synchronous system to malfunction. The effects of parameter variations on the timing characteristics of registers that determine the timing constraints are investigated in this paper. The sensitivity of the setup time and data propagation delay to parameter variations is demonstrated for four different register designs. The robustness of each register design under variations in power supply voltage, temperature, and gate oxide thickness is determined.

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References

  1. Kourtev, S., Friedman, E.G.: Timing Optimization Through Clock Skew Scheduling. Kluwer Academic Publishers, Norwell (2000)

    MATH  Google Scholar 

  2. Sauter, S., Schmitt-Landsiedel, D., Thewes, R., Weber, W.: Effect of parameter variations at chip and wafer level on clock skews. IEEE Transactions on Semiconductor Manufacturing 13(4), 395–400 (2000)

    Article  Google Scholar 

  3. Natarajan, S., Breuer, M.A., Gupta, S.K.: Process variations and their impact on circuit operation. In: Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1998, pp. 73–81 (1998)

    Google Scholar 

  4. Tang, K.T., Friedman, E.G.: Delay and noise estimation of cmos logic gates driving coupled rc interconnections. Integration, the VLSI Journal 29(2), 131–165 (2000)

    Article  MATH  Google Scholar 

  5. Velenis, D., Papaefthymiou, M.C., Friedman, E.G.: Reduced delay uncertainty in high performance clock distribution networks. In: Proceedings of the IEEE Design Automation and Test in Europe Conference, March 2003, pp. 68–73 (2003)

    Google Scholar 

  6. Sitte, R., Dimitrijev, S., Harrison, H.B.: Device parameter changes caused by manufacturing fluctuations of deep submicron mosfet’s. IEEE Transactions on Electron Devices 41(11), 2210–2215 (1994)

    Article  Google Scholar 

  7. Weste, N.H., Harris, D.: CMOS VLSI Design: A Circuits and Systems Perspective, 3rd edn. Addison-Wesley, Boston (May 2004)

    Google Scholar 

  8. Gerosa, G., Gary, S., Dietz, C., Pham, D., Hoover, K., Alverez, J., Sanchez, H., Ippolito, P., Ngo, T., Litch, S., Eno, J., Golab, J., Vanderschaaf, N., Kahle, J.: A 2.2 w, 80 mhz superscaler risc microprocessor. IEEE Journal of Solid-State Circuits 29(12), 1440–1454 (1994)

    Article  Google Scholar 

  9. Stojanovic, V., Oklobzijia, V.G.: Comparative analysis of master-slave latches and flip flops for high-performance and low-power systems. IEEE Journal of Solid-State Circuits 34(4), 536–548 (1999)

    Article  Google Scholar 

  10. Partovi, H., Burd, R., Salim, U., Weber, F., DiGregorio, L., Draper, D.: Flowthrough latch and edge-triggered flip-flop hybrid elements. In: IEEE International Solid-State Circuits Conference, February 1996, pp. 138–139 (1996)

    Google Scholar 

  11. Mezhiba, V., Friedman, E.G.: Power Distribution Networks in High Speed Integrated Circuits. Kluwer Academic Publishers, Norwell (2004)

    Google Scholar 

  12. S.I.A., The national technology roadmap for semiconductors. Semiconductor Industry Association, Tech. Rep. (2003)

    Google Scholar 

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© 2005 Springer-Verlag Berlin Heidelberg

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Roberts, W.R., Velenis, D. (2005). Parameter Variation Effects on Timing Characteristics of High Performance Clocked Registers. In: Paliouras, V., Vounckx, J., Verkest, D. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2005. Lecture Notes in Computer Science, vol 3728. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11556930_52

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  • DOI: https://doi.org/10.1007/11556930_52

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-29013-1

  • Online ISBN: 978-3-540-32080-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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