Abstract
Three-dimensional planar profile sampling of surfaces is a very common method of structural recovery in 3D scanning. In handheld 3D scanners, this has scarcely ever been taken into account resulting in poor precision ratings. Therefore, in this text we will describe a novel use of the profiling geometrical context to derive an intuitive and physically meaningful approach on solving the 3D profile registration problem. We will finish by describing the global optimisation algorithm and by showing experimental results achieved with a 3D scanner prototype comprising a camera, a laser-plane projector and a pose sensor.
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Ferreira, J.F., Dias, J. (2005). Three-Dimensional Planar Profile Registration in 3D Scanning. In: Kamel, M., Campilho, A. (eds) Image Analysis and Recognition. ICIAR 2005. Lecture Notes in Computer Science, vol 3656. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11559573_76
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DOI: https://doi.org/10.1007/11559573_76
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-29069-8
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