Abstract
A test suite, constructed either manually or automatically using a coverage criterion, can be reduced without significantly reducing its fault-detection capability by eliminating all but one of the equivalent test cases from each class of equivalent test cases of the test suite. In this paper, we use the analysis of control and data dependencies in an EFSM model of the system requirements to identify patterns of interaction among the elements of the EFSM that affect a requirement under test. These patterns are used to identify equivalent test cases w.r.t. the requirement under test; only one test case per equivalence class is kept, and equivalence classes that are not covered by any test cases are flagged. A software tool – Test Suite Reduction (TSR) based on above concept- is introduced. This tool is implemented in C++ and Java languages and runs on Sun workstations under Solaris Sparc 5.8. Additionally, the results of the application of TSR to several examples are also presented.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Tahat, L., Vaysburg, B., Korel, B., Bader, A.: Requirement-based automated black-box test generation. In: IEEE COMPSAC, pp. 489–495 (2001)
Bourhfir, C., Dssouli, R., Aboulhamid, E.M.: Automatic test generation for EFSM-based systems. Tech. Rep. IRO 1043, University of Montreal (1996)
Vaysburg, B., Tahat, L., Korel, B.: Dependence analysis in reduction of requirement based test suites. In: International Symposium on Software Testing and Analysis (ISSTA 2002), Roma, Italy, pp. 107–111. ACM Press, New York (2002)
Saleh, K., Ural, H., Williams, A.: Test generation based on control and data dependencies within system specifications in sdl. Computer Communications 23, 609–627 (2000)
Ural, H., Yang, B.: A test sequence selection method for protocol testing. IEEE Transactions on Communications 39, 514–523 (1991)
Rapps, S., Weyuker, E.J.: Selecting software test data using data flow information. IEEE Trans. Software Eng. 11, 367–375 (1985)
Frankl, P.G., Weyuker, E.J.: An applicable family of data flow testing criteria. IEEE Trans. Software Eng. 14, 1483–1498 (1988)
Ferrante, K., Ottenstein, K., Warren, J.: The program dependence graph and its use in optimization. ACM Trans. Progr. Lang. & Systems 9, 319–349 (1987)
Ural, H., et al.: TSR (2006), http://www.site.uottawa.ca/~ural/TSR
Chemli, O.: Reduced test suite generation. University of Ottawa, Master Thesis in Computer Science (2006)
Ritthiruangdech, P.: Test suite reduction using sdl and efsm dependency analysis. University of Ottawa, Master Thesis in Computer Science (2004)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Jourdan, GV., Ritthiruangdech, P., Ural, H. (2006). Test Suite Reduction Based on Dependence Analysis. In: Levi, A., Savaş, E., Yenigün, H., Balcısoy, S., Saygın, Y. (eds) Computer and Information Sciences – ISCIS 2006. ISCIS 2006. Lecture Notes in Computer Science, vol 4263. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11902140_106
Download citation
DOI: https://doi.org/10.1007/11902140_106
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-47242-1
Online ISBN: 978-3-540-47243-8
eBook Packages: Computer ScienceComputer Science (R0)