Abstract
In this paper, we show how artificial evolution can be used to improve the fault-tolerance of electronic circuits. We show that evolution is able to improve the fault tolerance of a digital circuit, given a known fault model. Evolution is also able to create sets of different circuits that, when combined into an ensemble of circuits, have reduced correlation in their fault pattern, and therefore improved fault tolerance. An important part of the algorithm used to create the circuits is a measure of the correlation between the fault patterns of different circuits. Using this measure in the fitness, the circuits evolve towards different, highly fault-tolerant circuits. The measure also proves very useful for fitness sharing purposes. We have evolved a number of circuits for a simple 2x3 multiplier problem, and use these to demonstrate the performance under different simulated fault models.
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Schnier, T., Yao, X. (2003). Using Negative Correlation to Evolve Fault-Tolerant Circuits. In: Tyrrell, A.M., Haddow, P.C., Torresen, J. (eds) Evolvable Systems: From Biology to Hardware. ICES 2003. Lecture Notes in Computer Science, vol 2606. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-36553-2_4
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DOI: https://doi.org/10.1007/3-540-36553-2_4
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