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An Approach to Symbolic Test Generation

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Integrated Formal Methods (IFM 2000)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 1945))

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Abstract

Test generation is a program-synthesis problem: starting from the formal specification of a system under test, and from a test purpose describing a set of behaviours to be tested, compute a reactive program that observes an implementation of the system to detect non- conformant behaviour, while trying to control it towards satisfying the test purpose. In this paper we describe an approach for generating sym- bolic test cases, in the form of input-output automata with variables and parameters.

The specifications and proofs for the example treated in the paper can be found at http://www.irisa.fr/pampa/perso/rusu/IFM00/.

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Author information

Authors and Affiliations

  1. IRISA/INRIA, Rennes, France

    Vlad Rusu, Lydie du Bousquet & Thierry Jéron

Authors
  1. Vlad Rusu
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  2. Lydie du Bousquet
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  3. Thierry Jéron
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Editor information

Editors and Affiliations

  1. Sekr.FR 5-13 bzw.5-6, TU Berlin, Franklinstr.28-29, 10587, Berlin, Germany

    Wolfgang Grieskamp  & Thomas Santen  & 

  2. School of Computing and Mathematics, University of Teesside, Middlesbrough, TS1 3BA, UK

    Bill Stoddart

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© 2000 Springer-Verlag Berlin Heidelberg

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Rusu, V., du Bousquet, L., Jéron, T. (2000). An Approach to Symbolic Test Generation. In: Grieskamp, W., Santen, T., Stoddart, B. (eds) Integrated Formal Methods. IFM 2000. Lecture Notes in Computer Science, vol 1945. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-40911-4_20

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  • DOI: https://doi.org/10.1007/3-540-40911-4_20

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-41196-3

  • Online ISBN: 978-3-540-40911-3

  • eBook Packages: Springer Book Archive

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