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Automatic Test Generation for Java Card Applets

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Java on Smart Cards:Programming and Security (JavaCard 2000)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2041))

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Abstract

Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet validation. In this article, we describe a methodology for Java Card applet verification, and its application on a case study. This methodology is based on automatic test generation. We first take benefits of the Java Card platform validation, focusing on application conformity testing. Then, using UML, we model the applet and its probable communication with other embedded elements. In the next step, the resulting model is used to automatically generate test suites, using UMLAUT and TGV tools. The full process is iterative and incremental, in order to conform to an object-oriented approach. Moreover, this incremental process allows integrating priorities on validation, by focusing first on main functions and properties.

This work is the result of a collaboration between Gemplus Research Labs and IRISA (project PAMPA).

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© 2001 Springer-Verlag Berlin Heidelberg

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Martin, H., du Bousquet, L. (2001). Automatic Test Generation for Java Card Applets. In: Attali, I., Jensen, T. (eds) Java on Smart Cards:Programming and Security. JavaCard 2000. Lecture Notes in Computer Science, vol 2041. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45165-X_10

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  • DOI: https://doi.org/10.1007/3-540-45165-X_10

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-42167-2

  • Online ISBN: 978-3-540-45165-5

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