Abstract
To be able to predict the importance of glitches in future deep-submicron processes with lowered supply and threshold voltages, a study has been conducted on designs, which experience glitching, at supply voltages in the range from 3.5 V to 1.0 V. The results show that the dynamic power consumption caused by glitches will, in comparison to the dynamic power consumption of transitions, be at least as important in the future as it is today.
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Eriksson, H., Larsson-Edefors, P. (2000). Impact of Voltage Scaling on Glitch Power Consumption. In: Soudris, D., Pirsch, P., Barke, E. (eds) Integrated Circuit Design. PATMOS 2000. Lecture Notes in Computer Science, vol 1918. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45373-3_14
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DOI: https://doi.org/10.1007/3-540-45373-3_14
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