Abstract
We present work we are engaged in to develop symbolic test generation techniques and apply those techniques to testing of smart card applications. Beginning with (1) a system specification and (2) a test purpose expressed as symbolic labelled-transition-systems, we automatically derive tests to check conformance of an implementation to the behaviors of the specification selected by the test purpose. We present an example taken from a case-study we are developing based on the application of these techniques to the CEPS e-purse specifications.
Supported in part by DYADE action FormalCard, a joint project of INRIA and Bull/CP-8.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
A. Belinfante, J. Feenstra, R. de Vries, J. Tretmans, N. Goga, L. Feijs, and S. Mauw. Formal test automation: a simple experiment. In International Workshop on the Testing of Communication Systems (IWTCS’99), pages 179–196, 1999.
M. Bozga, J.-C. Fernandez, L. Ghirvu, S. Graf, J.P. Krimm, and L. Mounier. If: An intermediate representation and validation environment for timed asynchronous systems. In Proceedings of World Conference on Formal Methods, FM’99, volume 1708 of LNCS, pages 307–327, Toulouse, France, September 1999. Springer-Verlag.
CEPSCO. Common Electronic Purse Specifications, Technical Specification (http://www.cepsco.org), May 2000.
ISO/IEC. LOTOS-a formal description technique based on the temporal ordering of observational behaviour. Technical Report 8807, International Organization for Standards-Information Processing Systems-Open Systems Interconnection, 1988.
ISO/IEC. International Standard 9646-1/2/3, OSI-Open Systems Interconnection, Information Technology-Open Systems Interconnection Conformance Testing Methodology and Framework, 1992.
ITU-T. Recommendation Z-100. Specification and Description Language (SDL), 1994.
T. Jéron and P. Morel. Test generation derived from model-checking. In Computer Aided Verification (CAV’ 99), volume 1633 of LNCS, pages 108–122, 1999.
A. Kerbrat, T. Jéron, and R. Groz. Automated test genration from SDL specifications. In Proceedings of SDL Forum. Elsevier Science (North Holland), 1999.
W. Kelly, V. Maslov, W. Pugh, E. Rosser, T. Shpiesman, and D. Wonnacott. The Omega library interface guide. Available at http://www.cs.umd.edu/projects/omega.
H. Martin and L. du Bousquet. Automatic test generation for java-card applets. In Proceedings of the Java-Card Workshop, Cannes, September 2000.
Vlad Rusu, Lydie du Bousquet, and Thierry Jéron. An approach to symbolic test generation. In International Conference on Integrating Formal Methods, volume 1945 of Lecture Notes in Computer Science, pages 338–357, Dagstuhl, Germany, November 2000. Springer-Verlag.
Sandra Rapps and Elaine J. Weyuker. Selecting software test data using data flow information. IEEE Transactions on Software Engineering, SE-11(4):367–375, April 1985.
J. Tretmans. A formal approach to conformance testing. In The 6th International Workshop on Protocol Test Systems, number C-19 in IFIP Transactions, pages 257–276, 1994.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2001 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Clarke, D., Jéron, T., Rusu, V., Zinovieva, E. (2001). Automated Test and Oracle Generation for Smart-Card Applications. In: Attali, I., Jensen, T. (eds) Smart Card Programming and Security. E-smart 2001. Lecture Notes in Computer Science, vol 2140. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45418-7_6
Download citation
DOI: https://doi.org/10.1007/3-540-45418-7_6
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-42610-3
Online ISBN: 978-3-540-45418-2
eBook Packages: Springer Book Archive