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Coarse-Grain Parallelization of Test Vectors Generation on Multiprocessor Systems

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Advanced Environments, Tools, and Applications for Cluster Computing (IWCC 2001)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2326))

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Abstract

The paper describes parallel implementation of automatic test vectors generation on multiprocessor systems using Boolean Difference Algorithm. The analysis of the algorithm points out that coarse-grain parallelization involves two types of data-dependencies that require different techniques for removing them: circuit model replication and mutual exclusion mechanisms. Toward balancing load of the work among processors, static and dynamic partitioning of computational task is studied. For each parallelization strategy, the theoretical speedup is estimated in order to select the most efficient implementation. The estimated and measured results show that the speed of automatic test generation can be significantly increased with parallel approach and this is an important achievement in the present technological context, with wide availability of multiprocessors stations.

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References

  1. Chakradhar, S., Agrawal, V.D., Bushnell, M.-Neural Models and Algorithms for Digital Testing, Kluwer Academic, Boston, 1991.

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© 2002 Springer-Verlag Berlin Heidelberg

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Ionescu, F., Ionescu, M., Coconu, C., Stoica, V. (2002). Coarse-Grain Parallelization of Test Vectors Generation on Multiprocessor Systems. In: Grigoras, D., Nicolau, A., Toursel, B., Folliot, B. (eds) Advanced Environments, Tools, and Applications for Cluster Computing. IWCC 2001. Lecture Notes in Computer Science, vol 2326. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-47840-X_24

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  • DOI: https://doi.org/10.1007/3-540-47840-X_24

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-43672-0

  • Online ISBN: 978-3-540-47840-9

  • eBook Packages: Springer Book Archive

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