Abstract
Profiling is critical on massively parallel architectures because the combination of a novel architecture and parallel high-level languages changes the rules of optimal program design. The MasPar profiler provides routine and statement level profiling, interactive browsing, and typeset hardcopy integrated into an existing graphical debugger. This integration allows entire programs or program fragments to be profiled without having to recompile.
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“grof: A Call Graph Execution Profiler”, S.L. Graham, P.B. Kessler, and M.K. McKusick, Proceedings of the SIGPLAN '82 Symposium on Compiler Construction, SIGPLAN Notices, Vol. 17, No. 6, pp. 120–126, June 1982.
“The MasPar MP-1 Architecture”, Tom Blank, Proceedings of the IEEE Compcom, IEEE, February 1990.
“MPL: A Data Parallel C”, Jonathan D. Becher and Kenneth M. Hansen, MasPar Computer Corporation Technical Report, TR001.1091, November 1991.
“Software to Support Massively Parallel Computing on the MP-1”, Peter Christy, Proceedings of the IEEE Compcom, IEEE, February 1990.
The MasPar Programming Environment Reference Manual, MasPar Computer Corporation, 1990.
Postscript Language Reference Manual, Adobe Systems Inc., Addison-Wesley, 1988.
Human Factors and Typography for More Readable Programs, Aaron Marcus and Ronald Backer, Addison-Wesley, 1990.
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© 1992 Springer-Verlag Berlin Heidelberg
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Becher, J.D., Beck, K.L. (1992). Profiling on a massively parallel computer. In: Bougé, L., Cosnard, M., Robert, Y., Trystram, D. (eds) Parallel Processing: CONPAR 92—VAPP V. VAPP CONPAR 1992 1992. Lecture Notes in Computer Science, vol 634. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-55895-0_402
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DOI: https://doi.org/10.1007/3-540-55895-0_402
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