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Note on two-dimensional pattern matching by optimal parallel algorithms

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Book cover Parallel Image Analysis (ICPIA 1992)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 654))

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Abstract

We discuss techniques for constructing parallel image identification algorithms: cutting images into small factors, and compressing images by a parallel reduction of large number of such independent factors into smaller objects. A version of Kedem Landau Palem algorithm for parallel one-dimensional and two-dimensional rectangular image recognition on a CRCW PRAM is presented. The crucial part in KLP algorithm is a suffix-prefix matching subprocedure. In our algorithm such a subprocedure is omitted. A novel algorithm for pattern-matching is proposed, more directly designed for two-dimensional objects. It does not use the multi-text/multi-pattern approach as in KLP algorithm. The importance of five types of factors in strings and images is emphasized A new useful type of two-dimensional factors is introduced: thin factors.

Work by this author is supported by PRC “Mathématiques-Informatique” & NATO Grant CRG 900293.

Work by this author is supported by the Polish Grant 2-11-90-91-01.

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Akira Nakamura Maurice Nivat Ahmed Saoudi Patrick S. P. Wang Katsushi Inoue

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© 1992 Springer-Verlag Berlin Heidelberg

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Crochemore, M., Rytter, W. (1992). Note on two-dimensional pattern matching by optimal parallel algorithms. In: Nakamura, A., Nivat, M., Saoudi, A., Wang, P.S.P., Inoue, K. (eds) Parallel Image Analysis. ICPIA 1992. Lecture Notes in Computer Science, vol 654. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-56346-6_33

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  • DOI: https://doi.org/10.1007/3-540-56346-6_33

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-56346-4

  • Online ISBN: 978-3-540-47538-5

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