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On single event upset error manifestation

  • Session 5: Fault injection
  • Conference paper
  • First Online:
Dependable Computing — EDCC-1 (EDCC 1994)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 852))

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Abstract

This paper addresses the problem of how faults in a radiation environment primarily manifest as errors in a complex device. Previous work in the area has focused on modelling the latching of transients. In this paper this modelling task is extended to the phenomenon of double soft errors. The first error manifestation of a single event upset (SEU) in a microprocessor is analysed and discussed on the basis of Californium-252 fault injection experiments on the microprocessors 68000 and 68070. For the 68000 microprocessor, the type of double errors that occur is explained by a model based on a study of the register file layout. The experiments show a significant fraction of SEUs causing two bits to flip in the primary error manifestation.

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Authors and Affiliations

  1. Department of Computer Engineering, Chalmers University of Technology, S-412 96, Göteborg, Sweden

    Rolf Johansson

Authors
  1. Rolf Johansson
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Klaus Echtle Dieter Hammer David Powell

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© 1994 Springer-Verlag Berlin Heidelberg

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Johansson, R. (1994). On single event upset error manifestation. In: Echtle, K., Hammer, D., Powell, D. (eds) Dependable Computing — EDCC-1. EDCC 1994. Lecture Notes in Computer Science, vol 852. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-58426-9_133

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  • DOI: https://doi.org/10.1007/3-540-58426-9_133

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-58426-1

  • Online ISBN: 978-3-540-48785-2

  • eBook Packages: Springer Book Archive

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