Abstract
This paper addresses the problem of how faults in a radiation environment primarily manifest as errors in a complex device. Previous work in the area has focused on modelling the latching of transients. In this paper this modelling task is extended to the phenomenon of double soft errors. The first error manifestation of a single event upset (SEU) in a microprocessor is analysed and discussed on the basis of Californium-252 fault injection experiments on the microprocessors 68000 and 68070. For the 68000 microprocessor, the type of double errors that occur is explained by a model based on a study of the register file layout. The experiments show a significant fraction of SEUs causing two bits to flip in the primary error manifestation.
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J. C. Pickel, “Single Event Upset Mechanisms and Predictions”, Tutorial Short Course IEEE 1983 Nuclear and Space Radiation Effects Conference, Gatlinburg, Tenn, USA, 1983.
H. Cha, E. M. Rudnick, G. S. Choi, J. H. Patel, R. K. Iyer, “A Fast and Accurate Gate-Level Transient Fault Simulation Environment”, Proc. 23th International Symposium on Fault Tolerant Computing (FTCS-23), June 1993.
K. W. Li, J. R. Armstrong, J. G. Tront, “An Hdl simulation of the effects of single event upsets on microprocessor program flow”, IEEE Transactions on Nuclear Science, vol 31, no. 6, 1984.
M. Rimen, J. Ohlsson, “A study of the error behavior of a 32-bit RISC subjected to simulated transient fault injection”, Proc. International Test Confenrence, 1992.
P. Lidén, P. Dahlgren, R. Johansson, J. Karlsson, “On Latching Probability of Particle Induced Transients in Combinational Networks”, Proc. 24th International Symposium on Fault Tolerant Computing (FTCS-24), June 1994.
U. Gunneflo, J. Karlsson, J. Torin, “Evaluation of Error Detecting Schemes Using Fault Injection by Heavy-ion Radiation”, Proc. 19th International Symposium on Fault Tolerant Computing (FTCS-19), June 1989.
J. Karlsson, P. Lidén, P. Dahlgren, R. Johansson, U. Gunneflo, “Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms”, IEEE Micro, vol 14, no 1, 1994.
R. Harboe-Sorensen, L. Adams, T. K. Sanderson, “A Summary of SEU Test Results Using Californium-252”, IEEE Transactions on Nuclear Science, vol 35, no. 6, 1988.
D. K. Nichols, L. S. Smith, G. A. Soli, R. K. Koga, W. A. Kolanski, “Latest Trends in Parts SEP Susceptibility From Heavy Ions”, IEEE Transactions on Nuclear Science, vol 36, no. 6, 1989.
D. K. Nichols, L. S. Smith, G. A. Soli, K. Watson, R. K. Koga, W. R. Crain, K. B. Crawford, S. J. Hansel, D. D. Lau, “Update on Parts SEE Susceptibility From Heavy Ions”, IEEE Transactions on Nuclear Science, vol 38, no. 6, 1991.
J. Karlsson, U. Gunneflo, J. Torin, “Use of Heavy-ion Radiation from Californium-252 for Fault Injection Experiments,” Proc. 1st IFIP Working Conference on Dependable Computing for Critical Applications, August, 1989.
R. Velazco, S. Karoui, T. Chapuis, D. Benezech, L. H. Roisier, “Heavy Ion Test Results for the 68020 Microprocessor and the 68882 Coprocessor”, IEEE Transactions on Nuclear Science, vol 39, no. 3, 1992.
R. Johansson, “On Single Event Phenomena in Microprocerssors”, Technical Report No. 162L, Dept. of Computer Engineering, Chalmers University of Technology, Göteborg, Sweden, 1993.
F. Anceau, “The Architecture of Microprocessors”, Addison-Wesley, 1986.
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© 1994 Springer-Verlag Berlin Heidelberg
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Johansson, R. (1994). On single event upset error manifestation. In: Echtle, K., Hammer, D., Powell, D. (eds) Dependable Computing — EDCC-1. EDCC 1994. Lecture Notes in Computer Science, vol 852. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-58426-9_133
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DOI: https://doi.org/10.1007/3-540-58426-9_133
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