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Ring-banyan network: A fault tolerant multistage interconnection network and its fault diagnosis

  • Session 12: Switching networks and hypercubes
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Dependable Computing — EDCC-1 (EDCC 1994)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 852))

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Abstract

In this paper. we describe the fault tolerant schemes for the multistage interconnection network (MIN) and its fault diagnosis. Firstly, we present a fault tolerant MIN and a adaptive self-routing scheme for the network. It can provide more multiple paths than the previous networks between an input/output pair of a network by adding extra links between switching elements in the same stage and modifying the self-routing scheme of the regular MIN. The presented routing scheme is as simple as that of the regular MIN, which is based on the topological relationships among the switching elements (SE's) that render a packet to the same destination with the regular self-routing. We present an algebraic proof to show the correctness of the scheme, and an analytic reliability analysis to provide quantitative comparisons with other some networks. Of the special notes is the finding that the network is more cost effective than the regular MIN and other augmented MIN's in terms of the reliability. Secondary. we consider the fault models in the fault detection and the location schemes. We present a new fault diagnosis scheme for the network.

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Authors and Affiliations

  1. Dept. of Computer Science, Korea Advanced Institute of Science and Technology, 373-1 Kusong-Dong, Yusung-Ku, 305-701, Taejon, Korea

    Jae-Hyun Park & Heung-Kyu Lee

  2. Control System Section, Electronics and Telecommunications Research Institute, P.O.Box 8, 305-606, Taejon, Korea

    Ju-Hyun Cho

Authors
  1. Jae-Hyun Park
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  2. Heung-Kyu Lee
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  3. Ju-Hyun Cho
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Editor information

Klaus Echtle Dieter Hammer David Powell

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© 1994 Springer-Verlag Berlin Heidelberg

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Park, JH., Lee, HK., Cho, JH. (1994). Ring-banyan network: A fault tolerant multistage interconnection network and its fault diagnosis. In: Echtle, K., Hammer, D., Powell, D. (eds) Dependable Computing — EDCC-1. EDCC 1994. Lecture Notes in Computer Science, vol 852. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-58426-9_155

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  • DOI: https://doi.org/10.1007/3-540-58426-9_155

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-58426-1

  • Online ISBN: 978-3-540-48785-2

  • eBook Packages: Springer Book Archive

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