Abstract
The paper deals with mesh-connected massively parallel systems affected by failures. The complexity of a local diagnostic procedure, based on new definitions of the local k-diagnosability and the r-fault-tolerance, is analysed. It depends on distances between individual fault clusters and on fault cluster diameters. In particular cases the minimum distance between fault clusters can be enlarged on the account of the maximum fault cluster diameter. The criterion function for the optimization of the diagnostic examination is proposed.
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© 1994 Springer-Verlag Berlin Heidelberg
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Trobec, R., Jerebic, I. (1994). Optimization of diagnostic examination. In: Buchberger, B., Volkert, J. (eds) Parallel Processing: CONPAR 94 — VAPP VI. VAPP CONPAR 1994 1994. Lecture Notes in Computer Science, vol 854. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-58430-7_66
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DOI: https://doi.org/10.1007/3-540-58430-7_66
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