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Meta-heuristics for circuit partitioning in parallel test generation

  • Workshop on Biologically Inspired Solutions to Parallel Processing Problems Albert V. Zomaya, The University of Western Australia Fikret Ercal, University of Missouri-Rolla Stephan Olariu, Old Dominion University
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Parallel and Distributed Processing (IPPS 1998)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 1388))

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Abstract

In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biology, respectively, and are the most popular meta-heuristics or general-purpose optimization strategies. A hybrid algorithm for circuit partitioning, which uses tabu search to improve the simulated annealing meta-heuristics, is also proposed and compared with pure tabu search and simulated annealing algorithms, and also with a genetic algorithm. The solutions obtained are compared and evaluated by including the hybrid partitioning algorithm in a parallel test generator which is used to determine the test patterns for the circuits of the frequently used ISCAS benchmark set.

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References

  1. Alpert, C.J., and Kahng, A., “Recent Developments in Netlist Partitioning: A survey”. Integration: the VLSIJournal, 19/ 1-2 (1995) 1–81. *** DIRECT SUPPORT *** A0008D07 00011

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Authors and Affiliations

  1. Dept. de Arquitectura de Computadores y Electrónica, Univ. Almeria, Almeria, Spain

    C. Gil & M. G. Montoya

  2. Dept. de Arquitectura y Tecnologfa de Computadores, Univ. Granada, Granada, Spain

    J. Ortega & A. F. Diaz

Authors
  1. C. Gil
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  2. J. Ortega
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  3. A. F. Diaz
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  4. M. G. Montoya
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José Rolim

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© 1998 Springer-Verlag Berlin Heidelberg

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Gil, C., Ortega, J., Diaz, A.F., Montoya, M.G. (1998). Meta-heuristics for circuit partitioning in parallel test generation. In: Rolim, J. (eds) Parallel and Distributed Processing. IPPS 1998. Lecture Notes in Computer Science, vol 1388. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-64359-1_702

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  • DOI: https://doi.org/10.1007/3-540-64359-1_702

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-64359-3

  • Online ISBN: 978-3-540-69756-5

  • eBook Packages: Springer Book Archive

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