Abstract
New methodology for pattern recognition is presented which is based on design of invariant reference points. It is shown that the k-NN distance classifier is a special case of this methodology. New classifiers within this framework are also described.
The work was sponsored by the grant of Institute of Radioelectronics
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© 1998 Springer-Verlag Berlin Heidelberg
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Ignasiak, K., Skarbek, W. (1998). Pattern Recognition by Invariant Reference Points. In: Polkowski, L., Skowron, A. (eds) Rough Sets and Current Trends in Computing. RSCTC 1998. Lecture Notes in Computer Science(), vol 1424. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-69115-4_44
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DOI: https://doi.org/10.1007/3-540-69115-4_44
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