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Definition
Wide baseline matching is the process of finding correspondences between two images of the same scene taken from widely separated views.
Background
Finding correspondences between images is a first and crucial step in many image processing applications, such as image registration, 3D reconstruction, object recognition, or robot navigation. As long as the images are taken from more or less the same viewpoint, this task is relatively easy. Indeed, under these conditions (usually referred to as small baseline), the corresponding image patch will look very similar, and also its location in the image will have changed only slightly, so a local search for the most similar image patch suffices to find correspondences.
However, when the baseline between the cameras (i.e., the distance between the camera projection centers) increases, finding correspondences becomes a significantly harder problem. First,...
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References
. Bay H, Ferrari V, Van Gool L (2005) Wide-baseline stereo matching with line segments. In: Proceedings of the IEEE conference on computer vision and pattern recognition (CVPR), vol 1, San Diego, pp 329–336
Fischler MA, Bolles RC (1981) Random sample consensus: a paradigm for model fitting with applications to image analysis and automated cartography. Commun ACM 24:381–395
. Harris C, Stephens M A (1988) combined corner and edge detector. In: Proceedings of the 4th Alvey vision conference, Manchester, pp 147–151
Lowe DG (2004) Distinctive image features from scale-invariant keypoints. Int J Comput Vis 60(2):91–110
. Matas J, Chum O, Martin U, Pajdla T (2002) Robust wide baseline stereo from maximally stable extremal regions. In: Proceedings of the British machine vision conference, vol 1, Cardiff, pp 384–393
Mikolajczyk K, Schmid C (2004) Scale and affine invariant interest point detectors. Int J Comput Vis 60(1):63–86
Mikolajczyk K, Tuytelaars T, Schmid C, Zisserman A, Matas J, Schaffalitzky F, Kadir T, Van Gool L (2005) A comparison of affine region detectors. Int J Comput Vis 65(1–2): 43–72
Moreels P, Perona P (2006) Evaluation of features detectors and descriptors base on 3D objects. Int J Comput Vis 73(3):263–284
Morel JM, Yu G (2009) ASIFT, a new framework for fully affine invariant image comparison. SIAM J Imaging Sci 2(2):438–469
Tuytelaars T, Van Gool L (2004) Matching widely separated views based on affine invariant regions. Int J Comput Vis 59(1):61–85
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Tuytelaars, T. (2014). Wide Baseline Matching. In: Ikeuchi, K. (eds) Computer Vision. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-31439-6_191
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DOI: https://doi.org/10.1007/978-0-387-31439-6_191
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