Abstract
This chapter reviews the process of 3DIC designing exploiting Through Silicon Via (TSV) technology. The chapter introduces the notion of re-architecting systems explicitly to exploit high density TSV processes. A particular focus is on (redesigned) memory on top of logic. This article also serves as a tutorial for the design of 3D specific systems.
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References
J. Kim, E. Song, J. Cho, J. Pak, J. Lee, H. Lee, K. Park, and J. Kim, “Through Silicon Via Equalizer,” in Proc. IEEE EPEPS ’09, Oct. 2009, pp. 13–16.
K. Banerjee, S. Souri, P. Kapur, and K. Saraswat, “3-D ICs: A Novel Chip Design for Improving Deep-Submicrometer Interconnect Performance and Systems-on-Chip Integration,” Proc. IEEE, Vol. 89, No. 5, 2001, pp. 602–633.
T. Thorolfsson, K. Gonsalves, and P. Franzon, “Design Automation for a 3DIC Processor for Synthetic Aperture Radar: A Case Study,” in Proc. DAC 2009, July 2009, pp. 51–56.
H.P. Hofstee, “Future Microprocessors and Off-Chip SOP Interconnect,” IEEE Trans. Adv. Packag, Vol. 27, No. 2, May 2004, pp. 301–303.
J.A. Burns, B.F. Aull, C.K. Chen, C.-L. Chen, C.L. Keast, J.M. Knecht, V. Suntharalinam, K. Warner, P.W. Wyatt, and D. Yost, “A Wafer-Scale 3-D Circuit Integration Technology,” IEEE Trans. ED, Vol. 53, No. 10, Oct. 2006, pp. 2507–2516.
S. Wilton and N. Jouppi, “CACTI: An Enhanced Cache Access and Cycle Time Model,” IEEE J Solid-State Circuits, Vol. 31, No. 5, Oct. 1996, pp. 677–688.
T. Thorolfsson, S. Melamed, G. Charles, and P. Franzon, “Comparative Analysis of Two 3D Integration Implementations of a SAR Processor,” in Proc. IIII 3DIC, 2009, pp. 1–4.
E. Marinissen and Y. Zorian, “Testing 3D Chips Containing Through-Silicon Vias,” in ITC, 2009, pp. 1–11.
M. Tsai, A. Klooz, A. Leonard, J. Appel, and P. Franzon, “Through Silicon Via (TSV) Defect/Pinhole Self Test Circuit for 3D-IC,” in IEEE Proc. 3DIC, 2009, pp. 1–8.
P.-Y. Chen, C.-W. Wu, and D. Ming, “On-Chip TSV Testing for 3D IC Before Bonding Using Sense Amplification,” in Proc. ATS’09, 2009, pp. 450–455.
S. Melamed, T. Thorolfsson, A. Srinivasan, E. Cheng, P. Franzon, and R. Davis, “Junction-Level Thermal Extraction and Simulation of 3DICs,” in Proc. IEEE 3DIC, 2009, pp. 1–7.
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Franzon, P.D., Davis, W.R., Thorolfsson, T. (2011). Design and Computer Aided Design of 3DIC. In: Sheibanyrad, A., Pétrot, F., Jantsch, A. (eds) 3D Integration for NoC-based SoC Architectures. Integrated Circuits and Systems. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7618-5_4
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DOI: https://doi.org/10.1007/978-1-4419-7618-5_4
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