Abstract
In the area of object-oriented technology two subjects have been researched recently: Design Patterns and Metrics. This paper discusses the influence wide-spread use of design patterns will have on some well established metrics. A cautious conclusion will be that several metrics will have to be reconsidered after design patterns are in common use.
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© 1996 Springer-Verlag London Limited
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Ververs, F., Pronk, C. (1996). On the Interaction between Metrics and Patterns. In: Murphy, J., Stone, B. (eds) OOIS’ 95. Springer, London. https://doi.org/10.1007/978-1-4471-1009-5_26
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DOI: https://doi.org/10.1007/978-1-4471-1009-5_26
Publisher Name: Springer, London
Print ISBN: 978-3-540-76010-8
Online ISBN: 978-1-4471-1009-5
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