Years and Authors of Summarized Original Work
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2003; Chang, Sapatnekar
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2005; Chang, Sapatnekar
Problem Definition
The timing behavior of integrated systems is strongly affected by the characteristics of transistors and wires in the system. Variations in the manufacturing process can cause drifts in these characteristics from one manufactured part to another. The traditional approach to addressing these variations was to choose a worst-case value for each process parameter, but this has become unsustainable in the face of current-day variations. Statistical timing analysis provides a computationally efficient way to translate the probability density function of the underlying process parameter spread to the distribution of circuit timing.
A key underlying structure for timing analysis is a graph G(V, E) of a combinational circuit, where the vertex set Vcorresponds to the gates, primary inputs, and primary outputs of the circuit, and each connection between these gates corresponds to an...
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Recommended Reading
Chang H, Sapatnekar SS (2003) Statistical timing analysis considering spatial correlations using a single PERT-like traversal. In: Proceedings of the IEEE/ACM international conference on computer-aided design, San Jose, pp 621–625
Chang H, Sapatnekar SS (2005) Statistical timing analysis under spatial correlations. IEEE Trans Comput-Aided Des Integr Circuits Syst 24(9):1467–1482
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Sapatnekar, S.S. (2016). Statistical Timing Analysis. In: Kao, MY. (eds) Encyclopedia of Algorithms. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-2864-4_742
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DOI: https://doi.org/10.1007/978-1-4939-2864-4_742
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