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Key Point Detection Techniques

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Proceedings of the International Conference on Advanced Intelligent Systems and Informatics 2019 (AISI 2019)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 1058))

Abstract

Image registration is a process to find the offset or misalignment between two or more images for a certain area to determine the required geometrical transformation that aligns points in one image with its corresponding in the other one. Generally, the operational goal of the registration process is a geometrical transformation for the input leading to geometrically agreement for input images, so that the matched pixels in the input images refer to the same region of the captured area. So, image registration can be applied in many applications such as change detection, mosaicking, creating super-resolution images etc. Registration process is divided into two categories: (1) Traditional methods and (2) Automated methods. For the traditional methods, the anchor, control, points are selected manually and applying the transformation model leading to time consuming and low accuracy. So, automatically detection of these points helps to recover the performance of manual selection. Registration process deals with many problems such as illumination changes, intensity variations, Different sensors, noise etc. So, its applications are mainly dependent on errors (multi temporal, multi view, or multi modal) occurred during capturing process. Feature detection, as a step of image registration process, aims to find a set of stable (invariant) distinctive key points or regions under varying conditions. Also, it is critical for the detector to be robust to changes in viewpoint, brightness, and other distortions. The goal of current paper is discussion and exhibition of the common corner detectors helping to be familiar with the various applied techniques for feature detection.

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Author information

Authors and Affiliations

  1. Military Technical College (MTC), Cairo, Egypt

    Abdelhameed S. Eltanany & A. S. Amein

  2. Egyptian Academy for Engineering & Advanced Technology (EAE&AT), Cairo, Egypt

    M. SAfy Elwan

Authors
  1. Abdelhameed S. Eltanany
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  2. M. SAfy Elwan
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  3. A. S. Amein
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Correspondence to Abdelhameed S. Eltanany .

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Editors and Affiliations

  1. Cairo University, Giza, Egypt

    Aboul Ella Hassanien

  2. The British University in Dubai, Dubai, United Arab Emirates

    Khaled Shaalan

  3. Ain Shams University, Cairo, Egypt

    Mohamed Fahmy Tolba

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Eltanany, A.S., SAfy Elwan, M., Amein, A.S. (2020). Key Point Detection Techniques. In: Hassanien, A., Shaalan, K., Tolba, M. (eds) Proceedings of the International Conference on Advanced Intelligent Systems and Informatics 2019. AISI 2019. Advances in Intelligent Systems and Computing, vol 1058. Springer, Cham. https://doi.org/10.1007/978-3-030-31129-2_82

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