Skip to main content

Regression-Based Line Detection Network for Delineation of Largely Deformed Brain Midline

  • Conference paper
  • First Online:
Medical Image Computing and Computer Assisted Intervention – MICCAI 2019 (MICCAI 2019)

Abstract

Brain midline shift is often caused by various clinical conditions such as high intracranial pressure, which can be deadly. To facilitate clinical evaluation, automated methods have been proposed to classify whether midline shift is severe or not, e.g., larger than 5 mm away from the ideal midline. There are only limited methods using landmark or symmetry, attempting to provide more intuitive results such as midline delineation. However, landmark- or symmetry-based methods could be easily affected by anatomical variability and large brain deformations. In this study, we formulated the midline delineation as a skeleton extraction task and proposed a novel regression-based line detection network (RLDN) for the robust midline delineation especially in largely deformed brains. Basically, the proposed method includes three parts: (1) multi-scale line detection, (2) weighted line integration, and (3) regression-based refinement. The first two parts were used to capture high-level semantic and low-level detailed information to extract deformed midline, while the last part was utilized to regress more accurate midline positions. We validated the RLDN on 100 training and 28 testing subjects with a mean midline shift of 7 mm and the maximum shift of 16 mm (induced by hemorrhage). Experimental results show that our proposed method achieves state-of-the-art accuracy with a mean line difference of \(1.17\pm 0.72\) mm and F1-score of 0.78 from manual delineations. Our proposed robust midline delineation method is also beneficial for other cases such as midline deformation from tumor, traumatic brain injury, and abscess.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Chen, M., et al.: Automatic estimation of midline shift in patients with cerebral glioma based on enhanced voigt model and local symmetry. Australas. Phys. Eng. Sci. Med. 38(4), 627–641 (2015)

    Article  Google Scholar 

  2. Chilamkurthy, S., et al.: Development and validation of deep learning algorithms for detection of critical findings in head CT scans. arXiv preprint arXiv:1803.05854 (2018)

  3. He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770–778 (2016)

    Google Scholar 

  4. Ke, W., Chen, J., Jiao, J., Zhao, G., Ye, Q.: SRN: side-output residual network for object symmetry detection in the wild. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1068–1076 (2017)

    Google Scholar 

  5. Liao, C.C., Xiao, F., Wong, J.M., Chiang, I.J.: Automatic recognition of midline shift on brain CT images. Comput. Biol. Med. 40(3), 331–339 (2010)

    Article  Google Scholar 

  6. Liu, R., et al.: Automatic detection and quantification of brain midline shift using anatomical marker model. Comput. Med. Imaging Graph. 38(1), 1–14 (2014)

    Article  MathSciNet  Google Scholar 

  7. Liu, Y., Cheng, M.M., Hu, X., Wang, K., Bai, X.: Richer convolutional features for edge detection. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 3000–3009 (2017)

    Google Scholar 

  8. Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition. arXiv preprint arXiv:1409.1556 (2014)

  9. Xie, S., Tu, Z.: Holistically-nested edge detection. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 1395–1403 (2015)

    Google Scholar 

  10. Yang, F., Li, X., Cheng, H., Guo, Y., Chen, L., Li, J.: Multi-scale bidirectional FCN for object skeleton extraction. In: Thirty-Second AAAI Conference on Artificial Intelligence, pp. 7461–7468 (2018)

    Google Scholar 

  11. Yi, K.M., Trulls, E., Lepetit, V., Fua, P.: LIFT: learned invariant feature transform. In: Leibe, B., Matas, J., Sebe, N., Welling, M. (eds.) ECCV 2016. LNCS, vol. 9910, pp. 467–483. Springer, Cham (2016). https://doi.org/10.1007/978-3-319-46466-4_28

    Chapter  Google Scholar 

  12. Zhao, H., Shi, J., Qi, X., Wang, X., Jia, J.: Pyramid scene parsing network. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2881–2890 (2017)

    Google Scholar 

  13. Zhao, K., Shen, W., Gao, S., Li, D., Cheng, M.M.: HI-FI: Hierarchical feature integration for skeleton detection. arXiv preprint arXiv:1801.01849 (2018)

Download references

Acknowledgements

This work was partially supported by the National Key Research and Development Program of China (2018YFC0116400).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Feng Shi .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2019 Springer Nature Switzerland AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Wei, H. et al. (2019). Regression-Based Line Detection Network for Delineation of Largely Deformed Brain Midline. In: Shen, D., et al. Medical Image Computing and Computer Assisted Intervention – MICCAI 2019. MICCAI 2019. Lecture Notes in Computer Science(), vol 11766. Springer, Cham. https://doi.org/10.1007/978-3-030-32248-9_93

Download citation

  • DOI: https://doi.org/10.1007/978-3-030-32248-9_93

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-32247-2

  • Online ISBN: 978-3-030-32248-9

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics