Abstract
As the number of Internet-of-Things (IoT) devices increases, ensuring the reliability of the IoT system has become a challenging job. Apart from the emerging security issues, reliable IoT system design depends on many other factors. In this work, for the first time, we have shown all the reliability challenges of an IoT system in details, which may arise due to the random faults. We have also proposed a mathematical formulation of the lifetime of the IoT system. Subsequently, we devise an algorithm which uses Lévy distribution-based duty cycling approach to improve the IoT network lifetime. We have validated our proposed method using Cooja simulation software. The simulation results show 1.5 \(\times \) increment in network lifetime for the IoT system using our proposed method than the state-of-the-artwork. We have also demonstrated that our proposed method does not degrade the network performance.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Wollschlaeger, M., Sauter, T., Jasperneite, J.: The future of industrial communication: automation networks in the era of the internet of things and industry 4.0. IEEE Ind. Electron. Mag. 11(1), 17–27 (2017)
Lucas-Estañ, M.C., Raptis, T.P., Sepulcre, M., Passarella, A., Regueiro, C., Lazaro, O.: A software defined hierarchical communication and data management architecture for industry 4.0. In: 2018 14th Annual Conference on Wireless On-Demand Network Systems and Services (WONS), pp. 37–44. IEEE (2018)
Shao, L., et al.: Compact modeling of thin film transistors for flexible hybrid IoT design. IEEE Des. Test 36, 6–14 (2019)
Ahmad, M.: Reliability models for the Internet of Things: a paradigm shift. In: 2014 IEEE International Symposium on Software Reliability Engineering Workshops, pp. 52–59. IEEE (2014)
Rosing, T.S.: Reliability and maintainability of IoT systems (2018)
Xing, L., Zhao, G., Wang, Y., Mandava, L.: Competing failure analysis in IoT systems with cascading functional dependence. In: 2018 Annual Reliability and Maintainability Symposium (RAMS), pp. 1–6. IEEE (2018)
Thomas, M.O., Rad, B.B.: Reliability evaluation metrics for Internet of Things, car tracking system: a review. Int. J. Inf. Technol. Comput. Sci. (IJITCS) 9(2), 1–10 (2017)
Raptis, T.P., Passarella, A., Conti, M.: Maximizing industrial IoT network lifetime under latency constraints through edge data distribution. In: 2018 IEEE Industrial Cyber-Physical Systems (ICPS), pp. 708–713. IEEE (2018)
Valls, V., Iosifidis, G., Salonidis, T.: Maximum lifetime analytics in IoT networks. In: IEEE INFOCOM 2019-IEEE Conference on Computer Communications, pp. 1369–1377. IEEE (2019)
Morin, E., Maman, M., Guizzetti, R., Duda, A.: Comparison of the device lifetime in wireless networks for the Internet of Things. IEEE Access 5, 7097–7114 (2017)
Airehrour, D., Gutiérrez, J., Ray, S.K.: Greening and optimizing energy consumption of sensor nodes in the Internet of Things through energy harvesting: challenges and approaches (2016)
Fafoutis, X., Elsts, A., Vafeas, A., Oikonomou, G., Piechocki, R.J.: On predicting the battery lifetime of IoT devices: experiences from the sphere deployments. In: RealWSN@ SenSys, pp. 7–12 (2018)
Cao, K., Xu, G., Zhou, J., Wei, T., Chen, M., Hu, S.: Qos-adaptive approximate real-time computation for mobility-aware IoT lifetime optimization. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 38, 1799–1810 (2018)
Li, Q., Gochhayat, S.P., Conti, M., Liu, F.: EnergIoT: a solution to improve network lifetime of IoT devices. Pervasive Mob. Comput. 42, 124–133 (2017)
Weibull, W., et al.: A statistical distribution function of wide applicability. J. Appl. Mech. 18(3), 293–297 (1951)
Black, J.R.: Electromigration–a brief survey and some recent results. IEEE Trans. Electron Devices 16(4), 338–347 (1969)
Laidler, K.J.: Chemical Kinetics, vol. 42. Harper & Row, New York (1987)
Guo, X., Verma, V., Gonzalez-Guerrero, P., Stan, M.R.: When “things” get older: exploring circuit aging in IoT applications. In: 2018 19th International Symposium on Quality Electronic Design (ISQED), pp. 296–301. IEEE (2018)
Dey, S., Dash, S., Nandi, S., Trivedi, G.: PGIREM: reliability-constrained IR drop minimization and electromigration assessment of VLSI power grid networks using cooperative coevolution. In: 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), pp. 40–45. IEEE (2018)
Dey, S., Nandi, S., Trivedi, G.: PGRDP: reliability, delay, and power-aware area minimization of large-scale VLSI power grid network using cooperative coevolution. In: Mandal, J.K., Sinha, D. (eds.) Intelligent Computing Paradigm: Recent Trends. SCI, vol. 784, pp. 69–84. Springer, Singapore (2020). https://doi.org/10.1007/978-981-13-7334-3_6
Dey, S., Dash, S., Nandi, S., Trivedi, G.: Markov chain model using lévy flight for VLSI power grid analysis. In: 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID), pp. 107–112. IEEE (2017)
Acknowledgements
The work is done as a part of the project title “Information Security Research and Development Centre (ISRDC)” under Information Security Education and Awareness (ISEA) Project (Phase-II) at IIT Guwahati. The authors would like to thank Ministry of Electronics and Information Technology (MeitY) and IIT Guwahati for the support.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2020 Springer Nature Switzerland AG
About this paper
Cite this paper
Dey, S., Bhale, P., Nandi, S. (2020). ReFIT: Reliability Challenges and Failure Rate Mitigation Techniques for IoT Systems. In: Rautaray, S., Eichler, G., Erfurth, C., Fahrnberger, G. (eds) Innovations for Community Services. I4CS 2020. Communications in Computer and Information Science, vol 1139. Springer, Cham. https://doi.org/10.1007/978-3-030-37484-6_7
Download citation
DOI: https://doi.org/10.1007/978-3-030-37484-6_7
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-37483-9
Online ISBN: 978-3-030-37484-6
eBook Packages: Computer ScienceComputer Science (R0)