Abstract
Cross-project software defect prediction solves the problem that traditional defect prediction can’t get enough data, but how to apply the model learned from the data of different mechanisms to the target data set is a new problem. At the same time, there is the problem that information redundancy in the training process leads to low accuracy. Based on the difference of projects, this paper uses MIC to filter features to solve the problem of information redundancy. At the same time, combined with the TrAdaboost algorithm, which is based on the idea of aggravating multiple classification error samples, this paper proposes a cross-project software prediction method based on feature selection and migration learning. Experimental results show that the algorithm proposed in this paper has better experimental results on AUC and F1.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Pizzi, N.J.: A fuzzy classifier approach to estimating software quality. Inf. Sci. 241, 1–11 (2013)
Nam, J., et al.: Heterogeneous defect prediction. IEEE Trans. Softw. Eng. 44, 874–896 (2017)
Xia, X., et al.: HYDRA: massively compositional model for cross-project defect prediction. IEEE Trans. Softw. Eng. 42, 977–998 (2016)
He, Z., et al.: An investigation on the feasibility of cross-project defect prediction. Autom. Softw. Eng. 19(2), 167–199 (2012)
Hall, T., et al.: A systematic literature review on fault prediction performance in software engineering. IEEE Trans. Softw. Eng. 38, 1276–1304 (2012)
Pan, S.J., Yang, Q.: A survey on transfer learning. IEEE Trans. Knowl. Data Eng. 22(10), 1345–1359 (2010)
Zhuang, F., et al.: Survey on transfer learning. J. Softw. 26(1), 26–39 (2015). (in Chinese)
Chen, X., et al.: A survey on cross-project software defect prediction methods. Chin. J. Comput. 041(001), 254–274 (2018). (in Chinese)
He, P., et al.: An empirical study on software defect prediction with a simplified metric set. Info. Softw. Technol. 59(mar), 170–190 (2015)
Amasaki, S., Kawata, K., Yokogawa, T.: Improving cross-project defect prediction methods with data simplification. In: Software Engineering Advanced Applications IEEE (2015)
Dai, W., Yang, Q., Xue, G., et a1.: Boosting for transfer learning. In: Proceedings of the 24th International Conference on Machine Learning, Corvallis, USA, 20—24 June 2007, pp. 93–200. ACM, New York (2007)
Chen, L., et al.: Negative samples reduction in cross-company software defects prediction. Inf. Softw. Technol. 62, 67–77 (2015)
Fagui, M., et al.: Cross-project software defect prediction based on instance transfer. J. Front. Comput. Sci. Technol. 10, 43–55 (2016)
Reshef, D.N., et al.: Detecting novel associations in large data sets. Science 334(6062), 1518–1524 (2011)
Acknowledgement
This work was supported by the National Key Research and Development Program of China under Grant 2016QY06X1205.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2020 Springer Nature Switzerland AG
About this paper
Cite this paper
Lei, T., Xue, J., Han, W. (2020). Cross-Project Software Defect Prediction Based on Feature Selection and Transfer Learning. In: Chen, X., Yan, H., Yan, Q., Zhang, X. (eds) Machine Learning for Cyber Security. ML4CS 2020. Lecture Notes in Computer Science(), vol 12488. Springer, Cham. https://doi.org/10.1007/978-3-030-62463-7_33
Download citation
DOI: https://doi.org/10.1007/978-3-030-62463-7_33
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-62462-0
Online ISBN: 978-3-030-62463-7
eBook Packages: Computer ScienceComputer Science (R0)