Abstract
The variability in manufacturing process and operating conditions has a significant impact on the operation of memristor devices, since it is usually implemented in nano-scale for higher density. The variability in thickness and area can be regarded as a source of variations in read and write times of memristor when using the device as a memory cell. Recently, there have been efforts to utilize this feature as a unique device ID (or so-called fingerprint) similar to its counterparts in static random-access memory (SRAM) and other non-volatile memories. In real systems, bit flips in the fingerprint caused by variability in the operating condition may increase the probability of false identity. In this study, we assess the effect of timing variability on false identity in write time-based random device fingerprint of memristor memory.
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References
Che, W., Plusquellic, J., Bhunia, S.: A non-volatile memory based physically unclonable function without helper data. In: Proceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design, pp. 148–153. IEEE Press (2014)
Eiroa, S., Castro, J., MartÃnez-RodrÃguez, M.C., Tena, E., Brox, P., Baturone, I.: Reducing bit flipping problems in sram physical unclonable functions for chip identification. In: 2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012), pp. 392–395. IEEE (2012)
Li, H., Hu, M.: Compact model of memristors and its application in computing systems. In: 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) pp. 673–678. IEEE (2010)
Merkel, C.: Thermal profiling in CMOS/memristor hybrid architectures (2011)
Nguyen, H.P., Nguyen, T.N., Seo, Y.S., Hwang, D., Shin, D.: Correction of bit-aliasing in memristor-based physically unclonable functions with timing variability. IEEE Access (2019)
Nguyen, T.N., Shin, D.: Statistical memristor-based temperature sensors without analog-to-digital conversion. In: 2018 IEEE 7th Non-Volatile Memory Systems and Applications Symposium (NVMSA), pp. 99–104. IEEE (2018)
Rajendran, J., Maenm, H., Karri, R., Rose, G.S.: An approach to tolerate process related variations in memristor-based applications. In: 2011 24th International Conference on VLSI Design, pp. 18–23. IEEE (2011)
Rose, G.S., McDonald, N., Yan, L.K., Wysocki, B.: A write-time based memristive PUF for hardware security applications. In: 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), pp. 830–833. IEEE (2013)
Strukov, D.B., Snider, G.S., Stewart, D.R., Williams, R.S.: The missing memristor found. Nature 453(7191), 80 (2008)
Yang, J.J., Strukov, D.B., Stewart, D.R.: Memristive devices for computing. Nat. Nanotechnol. 8(1), 13 (2013)
Yu, M., Devadas, S.: Secure and robust error correction for physical unclonable functions. IEEE Des. Test Comput. 27(1), 48–65 (2010)
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Nguyen, HP. et al. (2020). Assessment of False Identity by Variability in Operating Condition for Memristor Write Time-Based Device Fingerprints. In: Nguyen, N.T., Hoang, B.H., Huynh, C.P., Hwang, D., Trawiński, B., Vossen, G. (eds) Computational Collective Intelligence. ICCCI 2020. Lecture Notes in Computer Science(), vol 12496. Springer, Cham. https://doi.org/10.1007/978-3-030-63007-2_49
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DOI: https://doi.org/10.1007/978-3-030-63007-2_49
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