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Spatially Localized Perturbation GAN (SLP-GAN) for Generating Invisible Adversarial Patches

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Information Security Applications (WISA 2020)

Abstract

Deep Neural Networks (DNNs) are very vulnerable to adversarial attacks because of the instability and unreliability under the training process. Recently, many studies about adversarial patches have been conducted that aims to misclassify the image classifier model by attaching patches to images. However, most of the previous research employs adversarial patches that are visible to human vision, making them easy to be identified and responded to. In this paper, we propose a new method entitled Spatially Localized Perturbation GAN (SLP-GAN) that can generate visually natural patches while maintaining a high attack success rate. SLP-GAN utilizes a spatially localized perturbation taken from the most representative area of target images (i.e., attention map) as the adversarial patches. The patch region is extracted using the Grad-CAM algorithm to improve the attacking ability against the target model. Our experiment, tested on GTSRB and CIFAR-10 datasets, shows that SLP-GAN outperforms the state-of-the-art adversarial patch attack methods in terms of visual fidelity.

This work was supported by Institute of Information and Communications Technology Planning and Evaluation (IITP) grant funded by the Korea government(MSIT) (2019-0-01343, Regional strategic industry convergence security core talent training business). This research was supported by the MSIT(Ministry of Science and ICT), Korea, under the ITRC(Information Technology Research Center) support program(IITP-2020-0-01797) supervised by the IITP(Institute of Information & Communications Technology Planning & Evaluation).

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Kim, Y., Kang, H., Mukaroh, A., Suryanto, N., Larasati, H.T., Kim, H. (2020). Spatially Localized Perturbation GAN (SLP-GAN) for Generating Invisible Adversarial Patches. In: You, I. (eds) Information Security Applications. WISA 2020. Lecture Notes in Computer Science(), vol 12583. Springer, Cham. https://doi.org/10.1007/978-3-030-65299-9_1

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  • DOI: https://doi.org/10.1007/978-3-030-65299-9_1

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