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Aion Attacks: Manipulating Software Timers in Trusted Execution Environment

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Detection of Intrusions and Malware, and Vulnerability Assessment (DIMVA 2021)

Part of the book series: Lecture Notes in Computer Science ((LNSC,volume 12756))

Abstract

Side-channel attacks are a threat to secure software running in a Trusted Execution Environment (TEE). To protect Intel SGX applications from these attacks, researchers have proposed mechanisms to detect cache-probing and repeated interrupts that these attacks rely on. These defenses often rely on high-resolution timers. However, since there is no trusted high-resolution timer hardware module, developers have resorted to software timers, which unfortunately underestimate the scope of possible attacks. In this paper, we propose Aion attacks that manipulate the speed of a reference software timer to subvert defensive mechanisms against SGX side-channel attacks. Specifically, we introduce a CPU thermal attack that leverages the thermal management mechanism to change the execution speed of the timer thread, and a cache eviction attack that evicts the target timer counters and forces the system to load them from memory instead of cache. We evaluated the above Aion attacks and introduced an analytical model and show that software timers cannot be improved to fit the defenders under our attacks.

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Acknowledgement

We would like to thank Professor Yinqian Zhang, Dr. Sanchuan Chen and Oleksii Oleksenko for their help in SGX defensive frameworks. We appreciate Dr. Lianying Zhao, Tony Liao and colleagues from Baidu Research for their valuable advice on this paper.

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Correspondence to Wei Huang .

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Huang, W., Xu, S., Cheng, Y., Lie, D. (2021). Aion Attacks: Manipulating Software Timers in Trusted Execution Environment. In: Bilge, L., Cavallaro, L., Pellegrino, G., Neves, N. (eds) Detection of Intrusions and Malware, and Vulnerability Assessment. DIMVA 2021. Lecture Notes in Computer Science(), vol 12756. Springer, Cham. https://doi.org/10.1007/978-3-030-80825-9_9

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  • DOI: https://doi.org/10.1007/978-3-030-80825-9_9

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  • Online ISBN: 978-3-030-80825-9

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