Abstract
The production of logic devices faces the occurrence of faults during production. We analyze the complexity of testing a special type of logic device on inverse, adhesion, and constant input faults. The focus of this work is on devices that implement cryptographic functions. The aim is to demonstrate the effect of bijection of the function on the complexity of its testing. We find and prove the complexity values not only of the main faults but also of some frequently occurring subsets. The work shows that for a special case of the length of the text block is equal to the length of the key the complexity of testing cryptographic devices is asymptotically half the complexity of testing logic devices on the same types of input faults.
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The research was fulfilled under project UZB-Ind-2021-98 – “Research and development of stream encryption algorithm”.
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Ikramov, A., Juraev, G. (2021). The Complexity of Testing Cryptographic Devices on Input Faults. In: Yang, M., Chen, C., Liu, Y. (eds) Network and System Security. NSS 2021. Lecture Notes in Computer Science(), vol 13041. Springer, Cham. https://doi.org/10.1007/978-3-030-92708-0_12
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DOI: https://doi.org/10.1007/978-3-030-92708-0_12
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