Abstract
We investigate the influence of clock frequency on the success rate of a fault injection attack. In particular, we examine the success rate of voltage and electromagnetic fault attacks for varying clock frequencies. Using three different tests that cover different components of a System-on-Chip, we perform fault injection while its CPU operates at different clock frequencies. Our results show that the attack’s success rate increases with an increase in clock frequency for both voltage and EM fault injection attacks. As the technology advances push the clock frequency further, these results can help assess the impact of fault injection attacks more accurately and develop appropriate countermeasures to address them.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Similar content being viewed by others
References
Anderson, R., Kuhn, M.: Low cost attacks on tamper resistant devices. In: Christianson, B., Crispo, B., Lomas, M., Roe, M. (eds.) Security Protocols 1997. LNCS, vol. 1361, pp. 125–136. Springer, Heidelberg (1998). https://doi.org/10.1007/BFb0028165
Aumüller, C., Bier, P., Fischer, W., Hofreiter, P., Seifert, J.-P.: Fault attacks on RSA with CRT: concrete results and practical countermeasures. In: Kaliski, B.S., Koç, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260–275. Springer, Heidelberg (2003). https://doi.org/10.1007/3-540-36400-5_20
Balasch, J., Gierlichs, B., Verbauwhede, I.: An in-depth and black-box characterization of the effects of clock glitches on 8-bit MCUs. In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 105–114. IEEE (2011)
Bar-El, H., Choukri, H., Naccache, D., Tunstall, M., Whelan, C.: The sorcerer’s apprentice guide to fault attacks. Proc. IEEE 94(2), 370–382 (2006)
Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056–3076 (2012)
Bayon, P., et al.: Contactless electromagnetic active attack on ring oscillator based true random number generator. In: Schindler, W., Huss, S.A. (eds.) COSADE 2012. LNCS, vol. 7275, pp. 151–166. Springer, Heidelberg (2012). https://doi.org/10.1007/978-3-642-29912-4_12
Bayon, P., et al.: Contactless electromagnetic active attack on ring oscillator based true random number generator. In: Schindler, W., Huss, S.A. (eds.) COSADE 2012. LNCS, vol. 7275, pp. 151–166. Springer, Heidelberg (2012). https://doi.org/10.1007/978-3-642-29912-4_12
Biham, E., Shamir, A.: Differential fault analysis of secret key cryptosystems. In: Kaliski, B.S. (ed.) CRYPTO 1997. LNCS, vol. 1294, pp. 513–525. Springer, Heidelberg (1997). https://doi.org/10.1007/BFb0052259
Boneh, D., DeMillo, R.A., Lipton, R.J.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37–51. Springer, Heidelberg (1997). https://doi.org/10.1007/3-540-69053-0_4
Bozzato, C., Focardi, R., Palmarini, F.: Shaping the glitch: Optimizing voltage fault injection attacks. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2019, 199–224 (2019)
Cui, A., Housley, R.: BADFET: defeating modern secure boot using second-order pulsed electromagnetic fault injection. In: 11th \(\text{USENIX}\) Workshop on Offensive Technologies (\(\text{ WOOT }\) 17) (2017)
Dehbaoui, A., Dutertre, J.-M., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of AES. In: 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 7–15. IEEE (2012)
Dumont, M., Lisart, M., Maurine, P.: Electromagnetic fault injection : How faults occur. In: 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 9–16 (2019). https://doi.org/10.1109/FDTC.2019.00010
Elmohr, M.A., Liao, H., Gebotys, C.H.: EM fault injection on ARM and RISC-V. In: 2020 21st International Symposium on Quality Electronic Design (ISQED), pp. 206–212 (2020). https://doi.org/10.1109/ISQED48828.2020.9137051
Giraud, C.: DFA on AES. In: Dobbertin, H., Rijmen, V., Sowa, A. (eds.) AES 2004. LNCS, vol. 3373, pp. 27–41. Springer, Heidelberg (2005). https://doi.org/10.1007/11506447_4
Liao, H., Gebotys, C.: Methodology for EM fault injection: charge-based fault model. In: 2019 Design, Automation Test in Europe Conference Exhibition (DATE), pp. 256–259 (2019). https://doi.org/10.23919/DATE.2019.8715150
Moro, N., Dehbaoui, A., Heydemann, K., Robisson, B., Encrenaz, E.: Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller. In: 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 77–88. IEEE (2013)
Ordas, S., Guillaume-Sage, L., Tobich, K., Dutertre, J.-M., Maurine, P.: Evidence of a larger EM-induced fault model. In: Joye, M., Moradi, A. (eds.) CARDIS 2014. LNCS, vol. 8968, pp. 245–259. Springer, Cham (2015). https://doi.org/10.1007/978-3-319-16763-3_15
Riscure. Inspector fault injection (2020). https://getquote.riscure.com/en/inspector-fault-injection.html. Accessed 19 Aug 2022
Riviere, L., Najm, Z., Rauzy, P., Danger, J.L., Bringer, J., Sauvage, L.: High precision fault injections on the instruction cache of ARMv7-M architectures. In: 2015 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp. 62–67. IEEE (2015)
SiFive. FE310-G000 Datasheet (2017). https://sifive.cdn.prismic.io/sifive%2Ffeb6f967-ff96-418f-9af4-a7f3b7fd1dfc_fe310-g000-ds.pdf. Accessed 19 Aug 2022
SiFive. FE310-G000 Manual (2019). https://static.dev.sifive.com/FE310-G000.pdf. Accessed 19 Aug 2022
SiFive. HiFive1 Schematics (2016). https://sifive.cdn.prismic.io/sifive%2F080cdef9-4631-4c9b-b8f5-7937fbdec8a4_hifive1-a01-schematics.pdf. Accessed 19 Aug 2022
Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski, B.S., Koç, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2–12. Springer, Heidelberg (2003). https://doi.org/10.1007/3-540-36400-5_2
Timmers, N., Mune, C.: Escalating privileges in linux using voltage fault injection. In: 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 1–8 (2017)
Timmers, N., Spruyt, A., Witteman, M.: Controlling pc on ARM using fault injection. In: 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 25–35 (2016)
Vasselle, A., Thiebeauld, H., Maouhoub, Q., Morisset, A., Ermeneux, S.: Laser-induced fault injection on smartphone bypassing the secure boot. IEEE Trans. Comput. 69, 1449–1459 (2018)
Zussa, L., Dutertre, J.-M., Clediere, J., Tria, A.: Power supply glitch induced faults on FPGA: an in-depth analysis of the injection mechanism. In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), pp. 110–115. IEEE (2013)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2022 The Author(s), under exclusive license to Springer Nature Switzerland AG
About this paper
Cite this paper
Koffas, S., Vadnala, P.K. (2022). On the Effect of Clock Frequency on Voltage and Electromagnetic Fault Injection. In: Zhou, J., et al. Applied Cryptography and Network Security Workshops. ACNS 2022. Lecture Notes in Computer Science, vol 13285. Springer, Cham. https://doi.org/10.1007/978-3-031-16815-4_8
Download citation
DOI: https://doi.org/10.1007/978-3-031-16815-4_8
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-031-16814-7
Online ISBN: 978-3-031-16815-4
eBook Packages: Computer ScienceComputer Science (R0)