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Reliability Aware Global Routing of Graphene Nanoribbon Based Interconnect

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VLSI Design and Test (VDAT 2022)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 1687))

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Abstract

Graphene nanoribbon based interconnect has several advantageous properties over traditional interconnect like power dissipation, delay, and integration capability. But each wire segment of Graphene nanoribbon based interconnect has a chance of failure as each wire segment is associated with some survival probability. Hence reliability issues can play a major role in the routing of this type of interconnect. In this paper, we propose an algorithm for global routing of Graphene nanoribbon based interconnect considering reliability as an optimization function with minimum increase in cost. The cost due to routing of Graphene nanoribbon based interconnect depends on the interconnect length, angle of bending, and the number of bending, and this is known as the hybrid cost. The experiment is done on a random data set and the result shows the effectiveness of the method.

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Authors and Affiliations

  1. Institute of Radio Physics and Electronics, Calcutta University, Kolkata, India

    Subrata Das & Soumya Pandit

  2. Department of Computer Science and Engineering, Sister Nivedita University, Kolkata, Newtown, India

    Subrata Das

  3. Department of Computer Science and Engineering, Jadavpur University, Kolkata, India

    Debesh Kumar Das

Authors
  1. Subrata Das
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  2. Debesh Kumar Das
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  3. Soumya Pandit
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Corresponding author

Correspondence to Subrata Das .

Editor information

Editors and Affiliations

  1. Department of Electrical Engineering, Indian Institute of Technology Jammu, Jammu, India

    Ambika Prasad Shah

  2. Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, India

    Sudeb Dasgupta

  3. Department of Electronics Engineering, Sardar Vallabhbhai National Institute of Technology Surat, Surat, India

    Anand Darji

  4. Department of Computer Science and Engineering, Indian Institute of Technology Tirupati, Tirupati, India

    Jaynarayan Tudu

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Das, S., Das, D.K., Pandit, S. (2022). Reliability Aware Global Routing of Graphene Nanoribbon Based Interconnect. In: Shah, A.P., Dasgupta, S., Darji, A., Tudu, J. (eds) VLSI Design and Test. VDAT 2022. Communications in Computer and Information Science, vol 1687. Springer, Cham. https://doi.org/10.1007/978-3-031-21514-8_31

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  • DOI: https://doi.org/10.1007/978-3-031-21514-8_31

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-21513-1

  • Online ISBN: 978-3-031-21514-8

  • eBook Packages: Computer ScienceComputer Science (R0)

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