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Mura Defect Detection in Flat Panel Display Using B-Spline Approximation

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Mining Intelligence and Knowledge Exploration (MIKE 2021)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 13119))

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Abstract

Flat panel display (FDP) devices continue to grow at rapid rate and quite popular as a promising technology and evolve various investment opportunity. In this paper, a machine vision approach has been proposed for automatic inspection of mura defects in film or glass of flat panel display device. The proposed method is based on a Mura filter using B-spline global approximation method. Experimental result shows that the detection of mura defect has been performed on images data with high speed computational techniques and obtained robust results.

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Correspondence to Kishore Kunal .

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Kunal, K., Upadhyay, P.K., Ramasubramaniam, M., Xavier, M.J. (2022). Mura Defect Detection in Flat Panel Display Using B-Spline Approximation. In: Chbeir, R., Manolopoulos, Y., Prasath, R. (eds) Mining Intelligence and Knowledge Exploration. MIKE 2021. Lecture Notes in Computer Science(), vol 13119. Springer, Cham. https://doi.org/10.1007/978-3-031-21517-9_10

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  • DOI: https://doi.org/10.1007/978-3-031-21517-9_10

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-21516-2

  • Online ISBN: 978-3-031-21517-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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