Abstract
This paper explores the impact of wire bonding solutions on high-speed serial links, focusing on the co-design between on-chip and off-chip parameters to achieve a boost in system bandwidth. Despite traditional limitations, wire bonding can outperform flip-chip techniques when properly designed. This study investigates various cases with different in-band ripples and describes how to optimize the on-chip and bonding parameters accordingly. Additionally, the adoption of shunt peaking techniques is examined, which allows us to achieve a bandwidth boost of up to 3.82 times. While on-chip parameters can be well controlled, the limited mechanical precision of wire bonding may lead to suboptimal wire lengths. An analysis of the variation in bandwidth boost and ripple is presented, indicating that wire length variations below 10% result in minimal impact on boosting effects and ripple. In conclusion, wire bonding offers advantages for high-speed serial links, and co-design optimizes system performance. Properly designed, wire bonding is an attractive choice for high-speed applications, outperforming flip-chip techniques in bandwidth enhancement.
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References
Sun L, et al (2022) SI/PI co-simulation analysis of high-speed I/O link. In: 2022 ICEPT, Dalian, China, pp 1–5
Monda D et al (2020) Analysis and comparison of rad-hard ring and LC-tank controlled oscillators in 65 nm for SpaceFibre applications. Sensors 20(16):4612
Monda D, et al (2021) Design and verification of a 6.25 GHz LC-tank VCO integrated in 65 nm CMOS technology operating up to 1 Grad TID. IEEE TNS 68(10):2524–2532
Božani´c M, et al (2019) Systems-level packaging for millimeter-wave transceivers. Springer, Vienna, Austria
Chang PH, et al (2021) Signal and power integrity analysis of a 0.38 pJ/bit 12.8 Gb/s parallel interface for die-to-die link applications. In: 2021 ECTC, CA, USA, pp 1264–1269
Ciarpi G et al (2022) Design and characterization of 10 Gb/s and 1 Grad TID-tolerant optical modulator driver. In: IEEE TCAS-I, vol 69, no 8, pp 3177–3189
Ciarpi G, et al (2019) Design, implementation, and experimental verification of 5 Gbps, 800 Mrad TID and SEU-tolerant optical modulators drivers. In: IEEE TCAS-I, vol 67, no 3, pp 829–838
Palla F et al (2019) Design of a high radiation-hard driver for Mach-Zehnder Modulators based high-speed links for hadron collider applications. Nucl Instrum Meth Phys Res, Sect A 936:303–304
Mestice M, et al (2020) Analysis and design of integrated blocks for a 6.25 GHz spacefibre PLL. Sensors 20(14):4013
Ciarpi G, et al (2023) A 10 Gb/s line driver in 65 nm CMOS technology for radiation-pervaded and high-temperature applications. IEEE Access
Kim J (2009) Design optimization of on-chip inductive peaking structures for 0.13-μm CMOS 40-Gb/s transmitter circuits. IEEE TCAS-I 56(12):2544–2555
Mokhtari A, et al (2020) Stochastic Quasi-Newton methods. Proc IEEE 108(11):1906–1922
Tao Z, et al (2017) High‐gain low‐cost broadband 60 GHz differential integrated patch array antennas with wire‐bonding packaging and on‐board compensation network. IET Microwaves Antennas Propag 11.7:971–975
Voinigescu S (2013) High-frequency integrated circuits. Cambridge University Press
Acknowledgments
This work was partially supported by the Dipartimento di Eccellenza Crosslab & FoReLab projects by the Italian Ministry of University and Research (MUR).
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Ciarpi, G., Mestice, M., Rossi, D., Saponara, S. (2024). Wire Bonding: Limitations and Opportunities for High-Speed Serial Communications. In: Bellotti, F., et al. Applications in Electronics Pervading Industry, Environment and Society. ApplePies 2023. Lecture Notes in Electrical Engineering, vol 1110. Springer, Cham. https://doi.org/10.1007/978-3-031-48121-5_3
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DOI: https://doi.org/10.1007/978-3-031-48121-5_3
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