Abstract
The miniaturization of electronic devices and the improved operating speeds increase the likelihood of single event faults. Differently from Single Event Upset (SEU) faults, Single Event Transient (SET) faults generally affect combinational logic, making all voting systems vulnerable to errors. The proposed work uses an ad-hoc fault-simulation campaign employing signal glitching to identify SET vulnerabilities inside a RISC-V core already equipped with resilience logic against Single Event Upset (SEU) faults. The faults target the majority voting logic structures, highlighting how they can be susceptible to faults depending on the width of the injected pulses, and showing how the use of Buffered Triple Modular Redundancy (BTMR) allows decreasing the total failure probability due to erroneous majority voters.
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Barbirotta, M. et al. (2024). Single Event Transient Reliability Analysis on a Fault-Tolerant RISC-V Microprocessor Design. In: Bellotti, F., et al. Applications in Electronics Pervading Industry, Environment and Society. ApplePies 2023. Lecture Notes in Electrical Engineering, vol 1110. Springer, Cham. https://doi.org/10.1007/978-3-031-48121-5_6
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DOI: https://doi.org/10.1007/978-3-031-48121-5_6
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