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Applicability Criterion of the Non Overlapping Template Matching Algorithm from NIST Statistical Test Suite SP800-22 for Long Aperiodic Patterns

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Computational Collective Intelligence (ICCCI 2024)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 14811))

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Abstract

The paper presents the problem of testing the randomness of bit strings in a pattern search using the Non Overlapping Template Matching algorithm. Presented problem arises when using long aperiodic patterns resulting in false-positive scores rejecting the generator as non-random. The paper proposes an additional criterion for the applicability of the algorithm, which allows to evade discussed problem.

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Authors and Affiliations

  1. Wrocław University of Science and Technology, Wrocław, Poland

    Piotr Paweł Jóźwiak

  2. Opole University of Technology, Opole, Poland

    Krzysztof Zatwarnicki

Authors
  1. Piotr Paweł Jóźwiak
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  2. Krzysztof Zatwarnicki
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Corresponding author

Correspondence to Piotr Paweł Jóźwiak .

Editor information

Editors and Affiliations

  1. Wrocław University of Science and Technology, Wrocław, Poland

    Ngoc Thanh Nguyen

  2. University of Leipzig, Leipzig, Germany

    Bogdan Franczyk

  3. University of Leipzig, Leipzig, Sachsen, Germany

    André Ludwig

  4. Universidad Complutense de Madrid, Madrid, Spain

    Manuel Núñez

  5. Vrije Universiteit Amsterdam, Amsterdam, Noord-Holland, The Netherlands

    Jan Treur

  6. University of Münster, Münster, Germany

    Gottfried Vossen

  7. Wrocław University of Science and Technology, Wrocław, Poland

    Adrianna Kozierkiewicz

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Jóźwiak, P.P., Zatwarnicki, K. (2024). Applicability Criterion of the Non Overlapping Template Matching Algorithm from NIST Statistical Test Suite SP800-22 for Long Aperiodic Patterns. In: Nguyen, N.T., et al. Computational Collective Intelligence. ICCCI 2024. Lecture Notes in Computer Science(), vol 14811. Springer, Cham. https://doi.org/10.1007/978-3-031-70819-0_27

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  • DOI: https://doi.org/10.1007/978-3-031-70819-0_27

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-70818-3

  • Online ISBN: 978-3-031-70819-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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