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A General Method to Evaluate the Correlation of Randomness Tests

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Information Security Applications (WISA 2013)

Part of the book series: Lecture Notes in Computer Science ((LNSC,volume 8267))

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Abstract

This paper discusses the correlation of the randomness tests. In this paper, we propose a new general method to evaluate the correlation of randomness tests. Firstly, we deduce the distribution that independent randomness tests should obey, then evaluate whether the randomness tests are independent or not based on hypothesis test. Using this method, we research the correlation of some statistical tests included in the NIST SP 800-22 suits, which is a collection of tests for the evaluation of both true random and pseudorandom number generators for cryptographic applications. Our experiment results show that some correlations of dependent exist among the randomness tests, which is different from the declaration that the randomness tests are independent by NIST. Moreover, the method we proposed also can be used in the study of parameter selection in randomness tests.

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References

  1. Knuth, D.E.: Seminumerical Algorithms. The Art of Computer Programming, vol. 2. Addison-Wesley, Reading (1981)

    MATH  Google Scholar 

  2. Sönmez Turan, M., Doğanaksoy, A., Boztaş, S.: On independence and sensitivity of statistical randomness tests. In: Golomb, S.W., Parker, M.G., Pott, A., Winterhof, A. (eds.) SETA 2008. LNCS, vol. 5203, pp. 18–29. Springer, Heidelberg (2008)

    Google Scholar 

  3. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications, National Institute of Standards and Technology (NIST) Special Publication 800–22, Revision 1a (2010)

    Google Scholar 

  4. Schindler, W.: AIS 20: Functionality Classes and Evaluation Methodology for Deterministic Random Number Generators, Bundesamt fur Sicherheit in der Informationstechnik (BSI) version 2.0 (1999)

    Google Scholar 

  5. Killmann, W., Schindler, W.: AIS 31: Functionality Classes and Evaluation Methodology for True (Physical) Random Number Generators, Bundesamt fur Sicherheit in der Informationstechnik (BSI) version 3.1 (2001)

    Google Scholar 

  6. Marsaglia, G.: The Marsaglia Random Number CD-ROM Including the DieHard Battery of Test of Randomness (1995). http://stat.fsu.edu/pub/diehard/

  7. Caelli, W., Dawson, E., Nielsen, L., Gustafson, H.: CRYPTCX Statistical Package Manual, Measuring the Strength of Stream and Block ciphers (1992)

    Google Scholar 

  8. Hamano, K., Satoh, F., Ishikawa, M.: Randomness test using discrete Fourier transform, Technical Report 6841. Technical Research and Development Institute, Japan Defense Agency (2003)

    Google Scholar 

  9. Hamano, K.: The distribution of the spectrum for the discrete Fourier transform test included in SP800-22. IEICE Trans. Fundam. E88–A(1), 67–73 (2005)

    Article  Google Scholar 

  10. Hamano, K.: Correction of overlapping template matching test included in NIST randomness test suite. ICICE Trans. Fundam. E90–A(9), 1788–1792 (2007)

    Article  Google Scholar 

  11. Hellekalek, P., Wegenkittl, S.: Empirical evidence concerning AES. ACM Trans. Model. Comput. Simul. (TOMACS) 13(04), 322–333 (2003)

    Article  Google Scholar 

  12. Fan, L., Feng, D., Chen, H.: On the relativity of binary derivation and autocorrelation randomness test. J. Comput. Res. Dev. 45(6), 956–961 (2009)

    Google Scholar 

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Acknowledgements

This work is supported by the National Natural Science Foundation of China (No.91118006) and the National Basic Research Program of China (973 Program, No.2013CB338002). Moreover, the authors are very grateful to the anonymous referees for their comments and editorial suggestions.

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Authors and Affiliations

  1. Trusted Computing and Information Assurance Laboratory, Institute of Software, Chinese Academy of Sciences, 100190 , Beijing, China

    Limin Fan, Hua Chen & Si Gao

Authors
  1. Limin Fan
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  2. Hua Chen
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  3. Si Gao
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Corresponding author

Correspondence to Limin Fan .

Editor information

Editors and Affiliations

  1. KAIST, Daejeon, Korea, Republic of (South Korea)

    Yongdae Kim

  2. Korea University, Seoul, Korea, Republic of (South Korea)

    Heejo Lee

  3. CyLab Carnegie Mellon University, Pittsburgh, Pennsylvania, USA

    Adrian Perrig

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Fan, L., Chen, H., Gao, S. (2014). A General Method to Evaluate the Correlation of Randomness Tests. In: Kim, Y., Lee, H., Perrig, A. (eds) Information Security Applications. WISA 2013. Lecture Notes in Computer Science(), vol 8267. Springer, Cham. https://doi.org/10.1007/978-3-319-05149-9_4

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  • DOI: https://doi.org/10.1007/978-3-319-05149-9_4

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-05148-2

  • Online ISBN: 978-3-319-05149-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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