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Precise Instruction-Level Side Channel Profiling of Embedded Processors

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Information Security Practice and Experience (ISPEC 2014)

Part of the book series: Lecture Notes in Computer Science ((LNSC,volume 8434))

Abstract

Since the first publication, side channel leakage has been widely used for the purposes of extracting secret information, such as cryptographic keys, from embedded devices. However, in a few instances it has been utilised for extracting other information about the internal state of a computing device. In this paper, we show how to create a precise instruction-level side channel leakage profile of an embedded processor. Using the profile we show how to extract executed instructions from the device’s leakage with high accuracy. In addition, we provide a comparison between several performance and recognition enhancement tools. Further, we also provide details of our lab setup and noise minimisation techniques, and suggest possible applications.

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Author information

Authors and Affiliations

  1. Smart Card Centre, Information Security Group, Royal Holloway, University of London, Egham, Surrey, TW20 0EX, UK

    Mehari Msgna, Konstantinos Markantonakis & Keith Mayes

Authors
  1. Mehari Msgna
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  2. Konstantinos Markantonakis
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  3. Keith Mayes
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Editor information

Editors and Affiliations

  1. School of Mathematics and Computer Science, Fujian Normal University, No. 32 Shangsan Road, 350007, Fuzhou, China

    Xinyi Huang

  2. Infocom Security Department, Institute for Infocomm Research, 1 Fusionopolis Way, #21-01 Connexis, South Tower, 138632, Singapore, Singapore

    Jianying Zhou

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Msgna, M., Markantonakis, K., Mayes, K. (2014). Precise Instruction-Level Side Channel Profiling of Embedded Processors. In: Huang, X., Zhou, J. (eds) Information Security Practice and Experience. ISPEC 2014. Lecture Notes in Computer Science, vol 8434. Springer, Cham. https://doi.org/10.1007/978-3-319-06320-1_11

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  • DOI: https://doi.org/10.1007/978-3-319-06320-1_11

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-06319-5

  • Online ISBN: 978-3-319-06320-1

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