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Loop-Carried Dependence Verification in OpenMP

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Using and Improving OpenMP for Devices, Tasks, and More (IWOMP 2014)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 8766))

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Abstract

Data dependence analysis is a very difficult task, mainly due to the limitations imposed by pointer aliasing, and by the overhead of dynamic data dependence analysis. Despite the huge effort to devise improved data dependence analysis techniques, the problem is still far from solved. Efficient methods to reduce memory and time overhead imposed by dynamic instrumentation are thus required to enable fast and correct program parallelization. This paper presents a novel dynamic loop-carried dependence checker integrated as a new extension to OpenMP, the parallel for check construct, which can be used to help programmers identify the existence of loop-carried dependences in parallel for constructs.

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Author information

Authors and Affiliations

  1. Institute of Computing, University of Campinas, Campinas, São Paulo, Brazil

    Juan Salamanca, Luis Mattos & Guido Araujo

Authors
  1. Juan Salamanca
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  2. Luis Mattos
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  3. Guido Araujo
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Editor information

Editors and Affiliations

  1. Cray Inc., Cray Plaza, 380 Jackson St., Suite 210, 55101, St. Paul, MN, USA

    Luiz DeRose

  2. Lawrence Livermore National Laboratory, 94551-0808, Livermore, CA, USA

    Bronis R. de Supinski

  3. Sandia National Laboratories, Albuquerque, NM, USA

    Stephen L. Olivier

  4. University of Houston, Houston, TX, USA

    Barbara M. Chapman

  5. RWTH Aachen, Aachen, Germany

    Matthias S. Müller

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© 2014 Springer International Publishing Switzerland

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Salamanca, J., Mattos, L., Araujo, G. (2014). Loop-Carried Dependence Verification in OpenMP. In: DeRose, L., de Supinski, B.R., Olivier, S.L., Chapman, B.M., Müller, M.S. (eds) Using and Improving OpenMP for Devices, Tasks, and More. IWOMP 2014. Lecture Notes in Computer Science, vol 8766. Springer, Cham. https://doi.org/10.1007/978-3-319-11454-5_7

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  • DOI: https://doi.org/10.1007/978-3-319-11454-5_7

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-11453-8

  • Online ISBN: 978-3-319-11454-5

  • eBook Packages: Computer ScienceComputer Science (R0)

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