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Ontological Patterns, Anti-Patterns and Pattern Languages for Next-Generation Conceptual Modeling

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Conceptual Modeling (ER 2014)

Part of the book series: Lecture Notes in Computer Science ((LNISA,volume 8824))

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Abstract

This paper addresses the complexity of conceptual modeling in a scenario in which semantic interoperability requirements are increasingly present. It elaborates on the need for developing sound ontological foundations for conceptual modeling but also for developing complexity management tools derived from these foundations. In particular, the paper discusses three of these tools, namely, ontological patterns, ontological anti-patterns and pattern languages.

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Author information

Authors and Affiliations

  1. Ontology and Conceptual Modeling Research Group (NEMO), Computer Science Department, Federal University of Espírito Santo (UFES), Vitória, ES, Brazil

    Giancarlo Guizzardi

Authors
  1. Giancarlo Guizzardi
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Editor information

Editors and Affiliations

  1. Faculty of Information, University of Toronto, 140 St. George St., M5S 3G6, Toronto, ON, Canada

    Eric Yu

  2. Dept of Computer Science, University of Auckland, Private Bag 92019, 1142, Auckland, New Zealand

    Gillian Dobbie

  3. Lehrstuhl Informatik 5, RWTH Aachen University, Ahornstr. 55, 52056, Aachen, Germany

    Matthias Jarke

  4. Penn State University, 316B Information Sciences and Technology Building, 16802, University Park, PA, USA

    Sandeep Purao

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Guizzardi, G. (2014). Ontological Patterns, Anti-Patterns and Pattern Languages for Next-Generation Conceptual Modeling. In: Yu, E., Dobbie, G., Jarke, M., Purao, S. (eds) Conceptual Modeling. ER 2014. Lecture Notes in Computer Science, vol 8824. Springer, Cham. https://doi.org/10.1007/978-3-319-12206-9_2

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  • DOI: https://doi.org/10.1007/978-3-319-12206-9_2

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-12205-2

  • Online ISBN: 978-3-319-12206-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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