Abstract
Error-related potential (ErrP) is a form of event-related potential (ERP) that is triggered in the brain when a user either makes a mistake or the application behaves differently from his/her intend. Unfortunately, due to its short-time duration, low signal-to-noise ratio, non-stationarity and transient characteristic, a single-trial extraction of ErrP remains a difficult task. In this study, we propose the use of one-unit second order blind identification with reference (SOBI-R) for extraction of ErrP in the context of steady-state visual evoked potentials based brain-computer interface (SSVEP-based BCI). Fractal features are extracted from the one-unit SOBI-R data by means of Katz fractal dimensional. At last, the ErrP classification is obtained using a regularized version of the linear discriminant analysis (LDA). The proposed method was tested on 6 subjects data and achieved an average recognition rate of correct and erroneous single-trials of \(87.03\%\) and \(80.7\%\), respectively. These results show that single-trial detection of ErrP is feasible for SSVEP-based BCI.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
Volosyak, I.: SSVEP-based Bremen-BCI Interface-Boosting Information Transfer Rates. J. Neural Eng. 8, 036020 (2011)
Gehring, W.J., Goss, B., Coles, M.G., Meyer, D.E., Donchin, E.: a Neural System for Error Detection and Compensation. Psychol. Sci. 4, 385–390 (1993)
Ferrez, P.W., Millan, J.D.: Simultaneous Real-time Detection of Motor Imaginary and Error-related Potentials for Improved BCI Accuracy. In: 4th International Brain-Computer Interface Workshop and Training Course, Graz, Austria, pp. 197–202 (2008)
Dal Seno, B., Matteucci, M., Mainardi, L.: Online Detection of P300 and Error Potentials in a BCI Speller. Comput. Intell. Neurosci. 11, 1–5 (2010)
Combaz, A., Chumerin, N., Manyakov, N.V., Robben, A., Suykens, J.A., Van Hulle, M.M.: Towards the Detection of Error-related Potentials and Its Integration in the Context of a P300 Speller Brain-computer Interface. Neurocomputing 80, 73–82 (2012)
Falkenstein, M.: ErrP Correlates of Erroneous Performance. In: Errors, Conflicts, and the Brain. Current Opinions on Performance Monitoring, 5–14 (2004)
Liu, H., Xie, X., Xu, S., Wan, F., Hu, Y.: One-unit Second-order Blind Identification with Reference for Short Transient Signals. Inform. Sciences 227, 90–101 (2013)
da Cruz, J.N., Wong, C.M., Wan, F.: An SSVEP-Based BCI with Adaptive Time-Window Length. In: Guo, C., Hou, Z.-G., Zeng, Z. (eds.) ISNN 2013, Part II. LNCS, vol. 7952, pp. 305–314. Springer, Heidelberg (2013)
Lin, Q.H., Zheng, Y.R., Yin, F.L., Liang, H., Calhoun, V.D.: a Fast Algorithm for One-unit ICA-R. Inform. Sciences 5, 1265–1275 (2007)
Hjorth, B.: EEG Analysis Based on Time Domain Properties. Electroencephalogr. Clin. Neurophysiol. 29, 306–310 (1970)
Esteller, R., Vachtsevanos, G., Echauz, J., Lilt, B.: a Comparison of Fractal Dimension Algorithms using Synthetic and Experimental Data. In: IEEE International Symposium on Circuits and Systems (ISCAS 1999), pp. 199–202. IEEE (1999)
Blankertz, B., Lemm, S., Treder, M., Haufe, S., Muller, K.R.: Single-Trial Analysis and Classification of ERP Components-a Tutorial. Neuroimage 56, 814–825 (2011)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2014 Springer International Publishing Switzerland
About this paper
Cite this paper
da Cruz, J.N., Wang, Z., Wong, C.M., Wan, F. (2014). Single-Trial Detection of Error-Related Potential by One-Unit SOBI-R in SSVEP-Based BCI. In: Zeng, Z., Li, Y., King, I. (eds) Advances in Neural Networks – ISNN 2014. ISNN 2014. Lecture Notes in Computer Science(), vol 8866. Springer, Cham. https://doi.org/10.1007/978-3-319-12436-0_58
Download citation
DOI: https://doi.org/10.1007/978-3-319-12436-0_58
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-12435-3
Online ISBN: 978-3-319-12436-0
eBook Packages: Computer ScienceComputer Science (R0)