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Planar Multi-classifier Modelling-NN/SVM: Application to Off-line Handwritten Signature Verification

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International Joint Conference (CISIS 2015)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 369))

Abstract

We present in this paper a new approach to modeling an image in a pattern recognition context. It relates to a generalization of the planar Markov modeling, which we shall call Planar Multi-Classifier Modeling (PMCM). These models allow exploring various classifier types, among others, Markov ones, to model delimited bands of an image associated with a given pattern. Determining the different parameters of the proposed planar model is made explicit. Various PMCM architectures are proposed; in this paper we present the PMCM-NN/SVM architecture. The validation has been performed in a security context based on off-line handwritten signature verification. The different experiments, carried out on two public databases: the SID-Signature database and the GPDS-160 Signature database, have led to promising results.

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Author information

Authors and Affiliations

  1. Higher Institute of Applied Sciences and Technology of Kairouan, UR: SAGE-ENISo, University of Sousse, Sousse, Tunisia

    Imen Abroug Ben Abdelghani

  2. National Engineering School of Sousse, UR: SAGE-ENISo, University of Sousse, Sousse, Tunisia

    Najoua Essoukri Ben Amara

Authors
  1. Imen Abroug Ben Abdelghani
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  2. Najoua Essoukri Ben Amara
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Corresponding author

Correspondence to Imen Abroug Ben Abdelghani .

Editor information

Editors and Affiliations

  1. Department of Civil Engineering, Escuela Politécnica Superior, University of Burgos, Burgos, Spain

    Álvaro Herrero

  2. Department of Civil Engineering, Escuela Politécnica Superior, University of Burgos, Burgos, Spain

    Bruno Baruque

  3. Technological Institute of Castilla y León, Burgos, Spain

    Javier Sedano

  4. University of Salamanca, Salamanca, Spain

    Héctor Quintián

  5. Plaza de la Merced S/N, University of Salamanca, Salamanca, Spain

    Emilio Corchado

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Abdelghani, I.A.B., Amara, N.E.B. (2015). Planar Multi-classifier Modelling-NN/SVM: Application to Off-line Handwritten Signature Verification. In: Herrero, Á., Baruque, B., Sedano, J., Quintián, H., Corchado, E. (eds) International Joint Conference. CISIS 2015. Advances in Intelligent Systems and Computing, vol 369. Springer, Cham. https://doi.org/10.1007/978-3-319-19713-5_8

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  • DOI: https://doi.org/10.1007/978-3-319-19713-5_8

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-19712-8

  • Online ISBN: 978-3-319-19713-5

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