Abstract
Electrical properties of thin films of La1-xSrxF3-x solid solutions with x = 0 ÷ 0.24 were measured in temperature range from RT to 300°C and wide frequency range from 10−1 to 106 Hz by impedance spectroscopy method. The spectrums of impedance were analyzed with equivalent circuits contain RC and Warburg parts. DC-conductivities were calculated from RC-circuit of impedance and activation energies determined from Arrhenius-Frenkel equation \( \sigma_{DC} T = \sigma_{0} e^{{\left( { - \frac{{E_{\sigma T} }}{kT}} \right)}} \). Diffusion coefficients and their temperature dependencies were determined from Warburg part of impedance for different SrF2 content.
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Vergentev, T.Y., Koroleva, E.Y., Rissing, L., Filimonov, A.V. (2015). Analysis of in-Plane Conductivity of La1-xSrxF3-x Superionic Thin Films. In: Balandin, S., Andreev, S., Koucheryavy, Y. (eds) Internet of Things, Smart Spaces, and Next Generation Networks and Systems. ruSMART NEW2AN 2015 2015. Lecture Notes in Computer Science(), vol 9247. Springer, Cham. https://doi.org/10.1007/978-3-319-23126-6_73
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DOI: https://doi.org/10.1007/978-3-319-23126-6_73
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