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Test Stand for Investigating of Giant Magneto-Impedance

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Automation 2017 (ICA 2017)

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 550))

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Abstract

The paper presents a test stand that will be used in study of Giant Magneto-Impedance (GMI) effect. Measuring system is based on primary electric law and basic instruments used in electrical metrology. GMI phenomena occurs when a magnetic material is subjected to a DC axial magnetic field and a high frequency AC current. It results in large impedance changes (up to 300%) depending on the value of magnetic field. GMI effect sensors are widely used in weak magnetic field detection. Results of the first experiment that proves proper operation of the test stand are presented. Construction of a test bench is the first step to perform extensive study on this promising technology.

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Acknowledgements

This work was partially supported by the statutory founds of Institute of Metrology and Biomedical Engineering, Warsaw University of Technology (Poland).

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Authors and Affiliations

  1. Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, sw. Andrzeja Boboli 8, 02-525, Warsaw, Poland

    Piotr Gazda & Maciej Szudarek

  2. Industrial Research Institute for Automation and Measurements, al. Jerozolimskie 202, 02-486, Warsaw, Poland

    Maciej Kachniarz

Authors
  1. Piotr Gazda
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  2. Maciej Kachniarz
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  3. Maciej Szudarek
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Corresponding author

Correspondence to Piotr Gazda .

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Editors and Affiliations

  1. Industrial Research Institute for Automation and Measurements PIAP, Warsaw, Poland

    Roman Szewczyk

  2. Industrial Research Institute for Automation and Measurements PIAP, Warsaw, Poland

    Cezary Zieliński

  3. Industrial Research Institute for Automation and Measurements PIAP, Warsaw, Poland

    Małgorzata Kaliczyńska

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Gazda, P., Kachniarz, M., Szudarek, M. (2017). Test Stand for Investigating of Giant Magneto-Impedance. In: Szewczyk, R., Zieliński, C., Kaliczyńska, M. (eds) Automation 2017. ICA 2017. Advances in Intelligent Systems and Computing, vol 550. Springer, Cham. https://doi.org/10.1007/978-3-319-54042-9_53

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  • DOI: https://doi.org/10.1007/978-3-319-54042-9_53

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-54041-2

  • Online ISBN: 978-3-319-54042-9

  • eBook Packages: EngineeringEngineering (R0)

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