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Algorithm for Uniform Test Assembly Using a Maximum Clique Problem and Integer Programming

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Artificial Intelligence in Education (AIED 2017)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 10331))

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Abstract

Educational assessments occasionally require “uniform test forms” for which each test form consists of a different set of items, but the forms meet equivalent test specifications (i.e., qualities indicated by test information functions based on item response theory). For uniform test assembly, one of most important issues is to increase the number of assembled tests. This study proposes a new algorithm, RIPMCP, to improve the number of assembled tests. RIPMCP applies a maximum clique algorithm and integer programming for assembling uniform tests. RIPMCP requires less computational space resources, thus, the proposal can assemble a greater number of tests than the previous methods on the same computational environment. Finally, we demonstrate the advantage of the proposal using simulated and actual data.

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Author information

Authors and Affiliations

  1. Tokyo University of Science, Tokyo, Japan

    Takatoshi Ishii

  2. University of Electro-Communications, Tokyo, Japan

    Maomi Ueno

Authors
  1. Takatoshi Ishii
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  2. Maomi Ueno
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Corresponding author

Correspondence to Takatoshi Ishii .

Editor information

Editors and Affiliations

  1. Human-Centered Multimedia, University of Augsburg, Augsburg, Germany

    Elisabeth André

  2. University of Pennsylvania, Philadelphia, Pennsylvania, USA

    Ryan Baker

  3. Department of Psychology, University of Memphis, Memphis, Tennessee, USA

    Xiangen Hu

  4. Ateneo de Manila University, Quezon City, Philippines

    Ma. Mercedes T. Rodrigo

  5. University of Sussex, Brighton, United Kingdom

    Benedict du Boulay

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Ishii, T., Ueno, M. (2017). Algorithm for Uniform Test Assembly Using a Maximum Clique Problem and Integer Programming. In: André, E., Baker, R., Hu, X., Rodrigo, M., du Boulay, B. (eds) Artificial Intelligence in Education. AIED 2017. Lecture Notes in Computer Science(), vol 10331. Springer, Cham. https://doi.org/10.1007/978-3-319-61425-0_9

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  • DOI: https://doi.org/10.1007/978-3-319-61425-0_9

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-61424-3

  • Online ISBN: 978-3-319-61425-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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