Abstract
The Classification Tree Method (CTM) is a structured and diagrammatic modeling technique for combinatorial testing. CTM can express the notion of “parameter shielding”, the phenomenon that some system parameters become invalidated depending on another system parameter. The current form of CTM, however, is limited in its expressiveness: it can only express parameter shielding that depends on a single parameter. In this paper, we extend CTM with parameter shielding that depends on multiple parameters, proposing CTM\(_{\textit{shield}}\). We evaluate the proposed extension on several industrial systems. The evaluation finds that parameter shielding often depends on multiple parameters in real systems, and the effectiveness of the extension.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Kuhn, D.R., Wallace, D.R., Gallo, A.M.: Software fault interactions and implications for software testing. IEEE Trans. Softw. Eng. 30(6), 418–421 (2004)
Kuhn, R.D., Kacker, R.N., Lei, Y.: Introduction to Combinatorial Testing. CRC Press, Boca Raton (2013)
Ammann, P., Offutt, J.: Introduction to Software Testing. Cambridge University Press, Cambridge (2008)
Grochtmann, M.: Test case design using classification trees. In: Proceedings of STAR 1994 (1994)
Lehmann, E., Wegener, J.: Test case design by means of the CTE XL. In: Proceedings of EuroSTAR (2000)
Kruse, P.M., Luniak, M.: Automated test case generation using classification trees. Softw. Qual. Prof. 13(1), 4–12 (2010)
Grochtmann, M., Wegener, J.: Test case design using classification trees and the classification-tree editor CTE. In: Proceedings of the of QW 1995 (1995)
Kitamura, T., Yamada, A., Hatayama, G., Artho, C., Choi, E.H., Do, N.T.B., Oiwa, Y., Sakuragi, S.: Combinatorial testing for tree-structured test models. In: Proceedings of QRS 2015, pp. 141–150. IEEE CPS (2015)
MODISTARC: OSEK/VDX operating system test plan version 2.0 (1999). http://www.osek-vdx.org/. Accessed 07 Mar 2016
Berner & Mattner: TESTONA ver.5.1.2 http://www.testona.net/en
Chen, B., Yan, J., Zhang, J.: Combinatorial testing with shielding parameters. In: Proceedings of APSEC 2010, pp. 280–289. IEEE CPS (2010)
Segall, I., Tzoref-Brill, R., Zlotnick, A.: Common patterns in combinatorial models. In: 2012 Proceedings of ICST 2012, Montreal, pp. 624–629. IEEE CPS (2012)
Zhao, Y., Zhang, Z., Yan, J., Zhang, J.: CASCADE: A test generation tool for combinatorial testing. In: Proceedings of ICSTW 2013, pp. 267–270. IEEE CPS (2013)
Cohen, D.M., Dalal, S.R., Fredman, M.L., Patton, G.C.: The AETG system: An approach to testing based on combinatiorial design. IEEE Trans. Softw. Eng. 23(7), 437–444 (1997)
Garvin, B.J., Cohen, M.B., Dwyer, M.B.: An improved meta-heuristic search for constrained interaction testing. In: Proceedings of SSBSE 2009, pp. 13–22 (2009)
Büning, H.K., Lettmann, T.: Propositional Logic Deduction and Algorithms. Cambridge University Press, Cambridge (1999)
Yamada, A., Kitamura, T., Artho, C., Choi, E.H., Oiwa, Y., Biere, A.: Optimization of combinatorial testing by incremental SAT solving. In: Proceedings of ICST 2015, pp. 1–10. IEEE CPS (2015)
Yamada, A., Biere, A., Artho, C., Kitamura, T., Choi, E.: Greedy combinatorial test case generation using unsatisfiable cores. In: Proceedings of ASE 2016, pp. 614–624. IEEE CPS (2016)
Acknowledgement
This work is partly supported by JST A-STEP grant AS2524001H.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2017 Springer International Publishing AG
About this paper
Cite this paper
Kitamura, T., Yamada, A., Hatayama, G., Sakuragi, S., Choi, EH., Artho, C. (2017). Classification Tree Method with Parameter Shielding. In: Tonetta, S., Schoitsch, E., Bitsch, F. (eds) Computer Safety, Reliability, and Security. SAFECOMP 2017. Lecture Notes in Computer Science(), vol 10488. Springer, Cham. https://doi.org/10.1007/978-3-319-66266-4_15
Download citation
DOI: https://doi.org/10.1007/978-3-319-66266-4_15
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-66265-7
Online ISBN: 978-3-319-66266-4
eBook Packages: Computer ScienceComputer Science (R0)