Abstract
This article presents a novel method for a combined extraction of points, lines and arcs in images. Geometric primitives are fitted into extracted edge pixels. In order to get points, the intersections between the geometric primitives are calculated. The method allows a precise and at the same time robust detection of the image features. By constructing a graph describing the topology between the features, more complex structures can be described over multiple connected primitives.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Akinlar, C., Topal, C.: EDCircles: real-time circle detection by Edge Drawing (ED). In: 2012 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), pp. 1309–1312, March 2012
Akinlar, C., Topal, C.: EDLines: a real-time line segment detector with a false detection control. Pattern Recognit. Lett. 32(13), 1633–1642 (2011)
Ballard, D.H.: Generalizing the Hough transform to detect arbitrary shapes. Pattern Recognit. 13(2), 111–122 (1981)
Bay, H., Ess, A., Tuytelaars, T., Van Gool, L.: Speeded-Up Robust Features (SURF). Comput. Vis. Image Underst. 110(3), 346–359 (2008)
Bonci, A., Leo, T., Longhi, S.: A Bayesian approach to the Hough transform for line detection. IEEE Trans. Syst. Man Cybern. - Part A: Syst. Hum. 35(6), 945–955 (2005)
Chia, A.Y.S., Rahardja, S., Rajan, D., Leung, M.K.: A split and merge based ellipse detector with self-correcting capability. IEEE Trans. Image Process. 20(7), 1991–2006 (2011)
Fitzgibbon, A., Pilu, M., Fisher, R.B.: Direct least square fitting of ellipses. IEEE Trans. Pattern Anal. Mach. Intell. 21(5), 476–480 (1999)
Harris, C., Stephens, M.: A combined corner and edge detector. In: Alvey Vision Conference. vol. 15, pp. 10–5244. Citeseer (1988)
Horaud, R., Veillon, F., Skordas, T.: Finding geometric and relational structures in an image. In: Faugeras, O. (ed.) ECCV 1990. LNCS, vol. 427, pp. 374–384. Springer, Heidelberg (1990). doi:10.1007/BFb0014886
Lowe, D.G.: Object recognition from local scale-invariant features. In: The Proceedings of the Seventh IEEE International Conference on Computer Vision, vol. 2, pp. 1150–1157. IEEE (1999)
Lu, W., Tan, J.: Detection of incomplete ellipse in images with strong noise by iterative randomized Hough transform (IRHT). Pattern Recognit. 41(4), 1268–1279 (2008)
Mai, F., Hung, Y.S., Zhong, H., Sze, W.F.: A hierarchical approach for fast and robust ellipse extraction. In: 2007 IEEE International Conference on Image Processing, vol. 5, pp. V-345–V-348, September 2007
Morevec, H.P.: Towards automatic visual obstacle avoidance. In: Proceedings of the 5th International Joint Conference on Artificial Intelligence, vol. 2, pp. 584–584. IJCAI 1977, Morgan Kaufmann Publishers Inc., San Francisco, CA, USA (1977)
Patraucean, V., Gurdjos, P., Grompone von Gioi, R.: Joint a contrario ellipse and line detection. IEEE Trans. Pattern Anal. Mach. Intell. 39(4), 788–802 (2017)
Schmid, C., Mohr, R., Bauckhage, C.: Evaluation of interest point detectors. Int. J. Comput. Vis. 37(2), 151–172 (2000)
Shi, J., Tomasi, C.: Good features to track. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 593–600, June 1994
Topal, C., Akinlar, C.: Edge drawing: a combined real-time edge and segment detector. J. Vis. Commun. Image Represent. 23(6), 862–872 (2012)
Wenzel, S., Förstner, W.: Finding poly-curves of straight line and ellipse segments. Photogrammetrie-Fernerkundung-Geoinformation 2013(4), 297–308 (2013)
Wolters, D., Koch, R.: Precise and robust line detection for highly distorted and noisy images. In: Rosenhahn, B., Andres, B. (eds.) GCPR 2016. LNCS, vol. 9796, pp. 3–13. Springer, Cham (2016). doi:10.1007/978-3-319-45886-1_1
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2017 Springer International Publishing AG
About this paper
Cite this paper
Wolters, D., Koch, R. (2017). Combined Precise Extraction and Topology of Points, Lines and Curves in Man-Made Environments. In: Roth, V., Vetter, T. (eds) Pattern Recognition. GCPR 2017. Lecture Notes in Computer Science(), vol 10496. Springer, Cham. https://doi.org/10.1007/978-3-319-66709-6_10
Download citation
DOI: https://doi.org/10.1007/978-3-319-66709-6_10
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-66708-9
Online ISBN: 978-3-319-66709-6
eBook Packages: Computer ScienceComputer Science (R0)