Abstract
In this article we investigate the field of Hilbertian metrics on probability measures. Since they are very versatile and can therefore be applied in various problems they are of great interest in kernel methods. Quit recently Topsøe and Fuglede introduced a family of Hilbertian metrics on probability measures. We give basic properties of the Hilbertian metrics of this family and other used metrics in the literature. Then we propose an extension of the considered metrics which incorporates structural information of the probability space into the Hilbertian metric. Finally we compare all proposed metrics in an image and text classification problem using histogram data.
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© 2004 Springer-Verlag Berlin Heidelberg
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Hein, M., Lal, T.N., Bousquet, O. (2004). Hilbertian Metrics on Probability Measures and Their Application in SVM’s. In: Rasmussen, C.E., Bülthoff, H.H., Schölkopf, B., Giese, M.A. (eds) Pattern Recognition. DAGM 2004. Lecture Notes in Computer Science, vol 3175. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-28649-3_33
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DOI: https://doi.org/10.1007/978-3-540-28649-3_33
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-22945-2
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