Abstract
This paper presents a novel approach to interconnect fault location for FPGAs during power-on sequence. The method is based on a concept known as fault grading which utilizes defect knowledge during manufacturing test to classify faulty devices into different defect groups. A Built-In Self-Test (BIST) method that can efficiently identify the exact location of the interconnect fault is introduced. This procedure forms the first step of a new interconnect defect tolerant scheme that offers the possibility of using larger and more cost effective devices that contain interconnect defects without compromising on performance or configurability.
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Campregher, N., Cheung, P.Y.K., Vasilko, M. (2004). BIST Based Interconnect Fault Location for FPGAs. In: Becker, J., Platzner, M., Vernalde, S. (eds) Field Programmable Logic and Application. FPL 2004. Lecture Notes in Computer Science, vol 3203. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30117-2_34
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DOI: https://doi.org/10.1007/978-3-540-30117-2_34
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-22989-6
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