Abstract
Randomness and uncertainty are rearing their heads in surprising and contradictory ways in nanometer technologies. On the one hand, uncertainty and variability is becoming a dominant factor in the design of integrated circuits, and on the other hand, algorithms based on randomness are beginning to show great promise in solving large scale problems. This paper overviews both aspects of this issue.
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Chang, H., Qian, H., Sapatnekar, S.S. (2004). The Certainty of Uncertainty: Randomness in Nanometer Design. In: Macii, E., Paliouras, V., Koufopavlou, O. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2004. Lecture Notes in Computer Science, vol 3254. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30205-6_6
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DOI: https://doi.org/10.1007/978-3-540-30205-6_6
Publisher Name: Springer, Berlin, Heidelberg
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