Abstract
There have been increasing interest in 3D surface contouring technologies over the last decade. 3D surface contouring techniques have numerous applications in design and manufacturing, 3D contouring technology is also used in reverse engineering where construction of a CAD model from a physical part is required. We propose a system based in the projected fringe technique. We present here early results of a potentially fast, efficient and reliable method to extract the surface contour of 3D external objects. A View Sonic PJ551 digital projector is used as active light source, and a DFK 50H13 CCD camera with a DFG/LC1 grabber are used to grab images. One advantage of projected fringe technique is that allows acquiring dense 3D data in few seconds.
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References
Herraéz, M.A., Burton, D.R., Clegg, D.B.: Robust, simple, and fast algorithm for phase unwrapping. Applied Optics 35, 5847–5852 (1996)
Herraéz, M.A., Burton, D.R., Lalor, M.J., Gdeisat, M.A.: Fast twodimensional automatic phase unwrapping algorithm based on sorting by reliability following a noncontinuous path. Applied Optics 41(35), 7437–7444 (2002)
Herraéz, M.A., Gdeisat, M.A., Burton, D.R., Lalor, M.J.: Robust, fast, and effective two-dimensional automatic phase unwrapping algorithm based on image decomposition. Applied Optics 41(35), 7445–7455 (2002)
Cusack, R., Huntley, J.M., Goldrein, H.T.: Improved noise-immune phaseunwrapping algoritm. Applied Optics 34(5), 781–789 (1995)
Ghiglia, D.C., Pritt, M.D.: Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software. Wiley, New York (1998)
Gorecki, C.: Interferogram analysis using a Fourier transform method for automatic 3D surface measurement. Pure and Applied Optics 1(2), 103–110 (1992)
Greivenkamp, J.E., Bruning, J.H.: Phase Shifting Interferometers. In: Optical Shop Testing, 2nd edn., pp. 501–598. Wiley, New York (1992)
Hariharan, P.: Interferogram Analysis: Digital Fringe Pattern Measurement Techniques. In: Robinson, W.R., Reid, G.T. (eds.) Applications of interferogram analysis, pp. 262–284. Institute of Physics Publishing, Bristol (1993) ISBN 075030197X
Hu, Q.: ”3-D Shape Measurement Based on Digital Fringe Projection and Phase-Shifting Techniques”, Ph. D. Thesis. State University of New York (2001)
Huntley, J.M., Saldner, H.O.: Error reduction methods for shape measurement by temporal phase unwrapping. Journal of Optical Society of America 14(2), 3188–3196 (1997)
Indebetouw, G.: Profile measurement using projection of running fringes. Appl. Opt. 17(18), 2930–2933 (1978)
Ji, Z., Leu, M.C.: Design of optical triangulation devices. SPIE: Optics and Laser Technology 21(5), 335–338 (1989)
Malacara, D.: Optical Shop Testing, 2nd edn. Wiley, New York, ISBN 0-471-52232-5
Shaw, M.M., Harvey, D.M., Hobson, C.A., Lalor, M.J.: Non-contact ranging using dynamic fringe projection. In: Proc. SPIE, 1163, pp. 22–29 (1989)
Wyant, J.C.: ”Phase-Shifting Interferometry”, Technical Report. Optical Sciences Center, University of Arizona (1998)
Zhang, S.: High-speed 3-D Shape Measurement Based on Digital Fringe Projection Technique. State University of New York (2003)
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Díaz, C., Altamirano, L. (2004). Projected Fringe Technique in 3D Surface Acquisition. In: Lemaître, C., Reyes, C.A., González, J.A. (eds) Advances in Artificial Intelligence – IBERAMIA 2004. IBERAMIA 2004. Lecture Notes in Computer Science(), vol 3315. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30498-2_60
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DOI: https://doi.org/10.1007/978-3-540-30498-2_60
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